Presentation 1997/4/24
Quantum Levels in InAs Self-Assembled Quantum Dots Estimated by Capacitance-Voltage Measurement
N. Horiguchi, T. Futatsugi, Y. Nakata, N. Yokoyama,
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Abstract(in English) We estimated the quantum levels in InAs self-assembled quantum dots by capacitance-voltage measurement. The quantum level of electron was estimated to be at 120 meV below the conduction band edge of GaAs. The quantum level of hole was estimated to be at 180 meV above the valence band edge of GaAs. The tunneling time constant between InAs dots and a doped layer was estimated from the frequency dependence of the capacitance peak due to quantum levels of InAs dots. The time constant of electron was estimated to be 4 to 5 orders smaller than that of hole.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InAs self-assembled quantum dot / quantum level / capacitance-voltage measurement / tunneling time constant
Paper # ED97-8,SDM97-8
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Committee SDM
Conference Date 1997/4/24(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Quantum Levels in InAs Self-Assembled Quantum Dots Estimated by Capacitance-Voltage Measurement
Sub Title (in English)
Keyword(1) InAs self-assembled quantum dot
Keyword(2) quantum level
Keyword(3) capacitance-voltage measurement
Keyword(4) tunneling time constant
1st Author's Name N. Horiguchi
1st Author's Affiliation Fujitsu Laboratories Ltd.()
2nd Author's Name T. Futatsugi
2nd Author's Affiliation Fujitsu Laboratories Ltd.
3rd Author's Name Y. Nakata
3rd Author's Affiliation Fujitsu Laboratories Ltd.
4th Author's Name N. Yokoyama
4th Author's Affiliation Fujitsu Laboratories Ltd.
Date 1997/4/24
Paper # ED97-8,SDM97-8
Volume (vol) vol.97
Number (no) 23
Page pp.pp.-
#Pages 8
Date of Issue