| Presentation | 1995/6/23 A study of the leakage effect on the earphone response measurement using the narrow slit approximation. Satoru Noge, Masaki Okada, Shokichiro Yoshikawa, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The leakage effect, earphone response measurement using the ear simulator standardized by IEC (International Erectrotechnical Commission), becomes a difficult problem. This report described the narrow slit approximation method to treat the leakage effect quantitatively at an earphone measurement. A sound pressure level change which fitted a earphone to a real ear is reproduced the narrow slit approximation method using the newly leakage adaptor and the IEC711 ear simulator. This measurement method using a leakage adaptor is very flexible and simple, so the leakage effect is defined giometicaly scale and the leakage parameter changing continuously and smoothly. This narrow slit approximation method that leakage adaptor defined parameter is successful for an equivalent circuit analysis of an earphone response. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | earphone / ear simulator / leakage effect / narrow slit / response |
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| Conference Information | |
| Committee | EA |
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| Conference Date | 1995/6/23(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Engineering Acoustics (EA) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A study of the leakage effect on the earphone response measurement using the narrow slit approximation. |
| Sub Title (in English) | |
| Keyword(1) | earphone |
| Keyword(2) | ear simulator |
| Keyword(3) | leakage effect |
| Keyword(4) | narrow slit |
| Keyword(5) | response |
| 1st Author's Name | Satoru Noge |
| 1st Author's Affiliation | Dept. of Electrical and Electronic Engineering KANAGAWA Institute of Technology() |
| 2nd Author's Name | Masaki Okada |
| 2nd Author's Affiliation | Dept. of Electrical and Electronic Engineering KANAGAWA Institute of Technology |
| 3rd Author's Name | Shokichiro Yoshikawa |
| 3rd Author's Affiliation | Dept. of Electrical and Electronic Engineering KANAGAWA Institute of Technology |
| Date | 1995/6/23 |
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| Volume (vol) | vol.95 |
| Number (no) | 128 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |