| Presentation | 1999/9/21 Temperature Coefficient Image of Dielectric Material using Scanning Electron-Beam Dielectric Microscopy Y. Cho, O. Jintsugawa, A. Sato, K. Yamanouchi, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Scanning Electron-Beam Dielectric Microscope / Temperature Coefficient of Dielectric constant / Dielectric Ceramics |
| Paper # | US99-50 |
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| Conference Information | |
| Committee | US |
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| Conference Date | 1999/9/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Ultrasonics (US) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Temperature Coefficient Image of Dielectric Material using Scanning Electron-Beam Dielectric Microscopy |
| Sub Title (in English) | |
| Keyword(1) | Scanning Electron-Beam Dielectric Microscope |
| Keyword(2) | Temperature Coefficient of Dielectric constant |
| Keyword(3) | Dielectric Ceramics |
| 1st Author's Name | Y. Cho |
| 1st Author's Affiliation | R.I.E.C., Tohoku University() |
| 2nd Author's Name | O. Jintsugawa |
| 2nd Author's Affiliation | R.I.E.C., Tohoku University |
| 3rd Author's Name | A. Sato |
| 3rd Author's Affiliation | R.I.E.C., Tohoku University |
| 4th Author's Name | K. Yamanouchi |
| 4th Author's Affiliation | Tohoku Institute of Technology |
| Date | 1999/9/21 |
| Paper # | US99-50 |
| Volume (vol) | vol.99 |
| Number (no) | 314 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |