Presentation 1999/2/12
Measurement of the thermal conductivity of CVD-diamond film by photoacoustic method
Nobuya TAKABATAKE, Takeshi KOBAYASHI, Kohji HOHKAWA,
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Abstract(in English) In the recent advanced technologies, thermophysical properties of thin films are needed for several research fields. In general, the thermal conductivity of CVD-diamond film has been measured using thermocouples. Photoacoustic technique, however, is one of a useful technique to determine the thermal conductivity of the thin film deposited on the substrate, because it can be measured without touching the sample. We applied it for measured the thermal conductivity on the vertical-depth direction to the diamond film deposited on the silicon wafer.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Diamond film / Thermal conductivity / Thin film / Photoacoustic technique / PAS
Paper # US98-107
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Committee US
Conference Date 1999/2/12(1days)
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Registration To Ultrasonics (US)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of the thermal conductivity of CVD-diamond film by photoacoustic method
Sub Title (in English)
Keyword(1) Diamond film
Keyword(2) Thermal conductivity
Keyword(3) Thin film
Keyword(4) Photoacoustic technique
Keyword(5) PAS
1st Author's Name Nobuya TAKABATAKE
1st Author's Affiliation Dept. Electrical and Electronic Eng., KANAGAWA Institute of Technology()
2nd Author's Name Takeshi KOBAYASHI
2nd Author's Affiliation Dept. Electrical and Electronic Eng., KANAGAWA Institute of Technology
3rd Author's Name Kohji HOHKAWA
3rd Author's Affiliation Dept. Electrical and Electronic Eng., KANAGAWA Institute of Technology
Date 1999/2/12
Paper # US98-107
Volume (vol) vol.98
Number (no) 587
Page pp.pp.-
#Pages 4
Date of Issue