Presentation 1993/6/18
Sub-micron electrode fabrication thechnology using anodic oxidation resist and application to SAW devices.
Kazuhiko Yamanouchi, Toshiyasu Meguro, Yasuo Wagatsuma, Hiroyuki Odagawa, Keiichi Yamamoto,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Sub-micon lithography technology is very important for high density integrated circuits and higher frequency-range SAW devices. The frequency range of mobile communication systems are now in 1 GHz and in extending to 2~4 GHz.Moreover SAW devices require the f requency range of around 10 GHz.In this paper,we propose a new lithography techniques of sub-micron electrodo width.The electrodes are fabricated by using very thin anodic oxidation films as resists and wet or dry etching techniques.The results show the 0.1μm width IDT with thickness of about 0.03μm on 128゜Y- X LiNbO_3.Also,new lithography technologies are applied to 1~2 GHz filters using the unidirectional transducer.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Nano-meter / Fine-Lithography / Anodic Oxidation / Inter- Digital Transducer / Surface Acoustic Wave / Low-Loss Filter
Paper # US93-16,CPM93-30
Date of Issue

Conference Information
Committee US
Conference Date 1993/6/18(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Ultrasonics (US)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Sub-micron electrode fabrication thechnology using anodic oxidation resist and application to SAW devices.
Sub Title (in English)
Keyword(1) Nano-meter
Keyword(2) Fine-Lithography
Keyword(3) Anodic Oxidation
Keyword(4) Inter- Digital Transducer
Keyword(5) Surface Acoustic Wave
Keyword(6) Low-Loss Filter
1st Author's Name Kazuhiko Yamanouchi
1st Author's Affiliation Research Institute of Electrical Communication,Tohoku University()
2nd Author's Name Toshiyasu Meguro
2nd Author's Affiliation Research Institute of Electrical Communication,Tohoku University
3rd Author's Name Yasuo Wagatsuma
3rd Author's Affiliation Research Institute of Electrical Communication,Tohoku University
4th Author's Name Hiroyuki Odagawa
4th Author's Affiliation Research Institute of Electrical Communication,Tohoku University
5th Author's Name Keiichi Yamamoto
5th Author's Affiliation Research Institute of Electrical Communication,Tohoku University
Date 1993/6/18
Paper # US93-16,CPM93-30
Volume (vol) vol.93
Number (no) 95
Page pp.pp.-
#Pages 6
Date of Issue