Presentation | 2001/10/6 YBCO Film Microwave Surface Resistance and Critical Current Density by Induced Reflection Magnetic Field Method Katsumi Suzuki, Takaharu Konno, Takeo Suzuki, Daisuke Yamashita, Hironobu Nakagaki, Akira Tamaki, Youichi Enomoto, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The superconductive critical current density is the parameter which is important for high power application of superconductive tapes and wires. However, the critical current density are not material proper physical constant but parameter value which greatly depends on manufacturing process parameters, such as pinning force the penetration depth. In this report, critical current density was examined based on the experimental technique of thickness dependence of a superconductive thin film from the viewpoint of pinning density and penetration depth. The pinning density was able to be estimated by using a YBCO thin film on the MgO substrate. The penetration depth was estimated by a 22GHz microwave surface resistance measurement. As a conclusion, the pinning density increased, as a YBCO thin film is thinner, and large current density was shown, as film thickness is less. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Microwave / Filter / YBCO thin-films / Surface resistance / Critical current density |
Paper # | SCE2001-26 |
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Conference Information | |
Committee | SCE |
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Conference Date | 2001/10/6(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | YBCO Film Microwave Surface Resistance and Critical Current Density by Induced Reflection Magnetic Field Method |
Sub Title (in English) | |
Keyword(1) | Microwave |
Keyword(2) | Filter |
Keyword(3) | YBCO thin-films |
Keyword(4) | Surface resistance |
Keyword(5) | Critical current density |
1st Author's Name | Katsumi Suzuki |
1st Author's Affiliation | Superconductivity Research Laboratory, ISTEC() |
2nd Author's Name | Takaharu Konno |
2nd Author's Affiliation | Superconductivity Research Laboratory, ISTEC |
3rd Author's Name | Takeo Suzuki |
3rd Author's Affiliation | Superconductivity Research Laboratory, ISTEC |
4th Author's Name | Daisuke Yamashita |
4th Author's Affiliation | Superconductivity Research Laboratory, ISTEC |
5th Author's Name | Hironobu Nakagaki |
5th Author's Affiliation | Superconductivity Research Laboratory, ISTEC |
6th Author's Name | Akira Tamaki |
6th Author's Affiliation | Tokyo Denki University |
7th Author's Name | Youichi Enomoto |
7th Author's Affiliation | Superconductivity Research Laboratory, ISTEC |
Date | 2001/10/6 |
Paper # | SCE2001-26 |
Volume (vol) | vol.101 |
Number (no) | 348 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |