Presentation 2001/4/18
Design of Circular Resonant Cavities for the Measurements of Dielectric Substrates
Zhewang Ma, Nobuyoshi Tanaka, Yoshio Kobayashi,
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Abstract(in English) Circular resonant cavities are used in the measurements of the complex permittivity of dielectric substrates. In order to split the degenerate TE_<01p> and TM_<11p>(p=1,2) modes in the cavity, we fabricate circular grooves into the cylindrical surface at the two ends of the cavity. By using the mode-matching method, we investigated the influence of the grooves on the resonant frequencies of TE_<01p> modes and TM_<11p> modes. Base on the obtained numerical results, we designed circular resonant cavities operating at 12GHz, 18GHz, 24GHz, and 36GHz, respectively.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Circular resonant cavity / Complex permittivity measurement / Mode-matching method / Degenerate modes
Paper # SCE2001-7,MW2001-7
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Committee SCE
Conference Date 2001/4/18(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Design of Circular Resonant Cavities for the Measurements of Dielectric Substrates
Sub Title (in English)
Keyword(1) Circular resonant cavity
Keyword(2) Complex permittivity measurement
Keyword(3) Mode-matching method
Keyword(4) Degenerate modes
1st Author's Name Zhewang Ma
1st Author's Affiliation Department of Electrical and Electronic System, Saitama University()
2nd Author's Name Nobuyoshi Tanaka
2nd Author's Affiliation Department of Electrical and Electronic System, Saitama University
3rd Author's Name Yoshio Kobayashi
3rd Author's Affiliation Department of Electrical and Electronic System, Saitama University
Date 2001/4/18
Paper # SCE2001-7,MW2001-7
Volume (vol) vol.101
Number (no) 23
Page pp.pp.-
#Pages 6
Date of Issue