Presentation 2001/1/17
Influence of thermal cycling on TLF observed in epitaxial NbN/MgO/NbN tunnel junctions
H. Ishida, Y. Takeuchi, A. Saito, A. Kawakami, Z. Wang, K. Hamasaki,
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Abstract(in English) We have investigated the influence of thermal cycling on TLF observed in NbN/MgO/NbN tunnel junctions epitaxially grown on MgO single crystals. The measured power density had a Lorentzian frequency dependence as expected from the Machlup formula for random telegraph noise. These spectra disappeared and appeared during repeated thermal cycling between 300 and 4.2K. We discussed in terms of the stresses develop in a thin film during thermal cycling because of the difference in the thermal-expansion coefficients for the film and the substrate.
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Keyword(in English) NbN/MgO/NbN tunnel junction / 1/f noise / Lorentzian spectra
Paper # SCE2000-40
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Committee SCE
Conference Date 2001/1/17(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Influence of thermal cycling on TLF observed in epitaxial NbN/MgO/NbN tunnel junctions
Sub Title (in English)
Keyword(1) NbN/MgO/NbN tunnel junction
Keyword(2) 1/f noise
Keyword(3) Lorentzian spectra
1st Author's Name H. Ishida
1st Author's Affiliation Department of Engineering, Nagaoka University of Technology()
2nd Author's Name Y. Takeuchi
2nd Author's Affiliation Department of Engineering, Nagaoka University of Technology
3rd Author's Name A. Saito
3rd Author's Affiliation Department of Engineering, Nagaoka University of Technology
4th Author's Name A. Kawakami
4th Author's Affiliation KARC Communication Research Laboratory
5th Author's Name Z. Wang
5th Author's Affiliation KARC Communication Research Laboratory
6th Author's Name K. Hamasaki
6th Author's Affiliation Department of Engineering, Nagaoka University of Technology
Date 2001/1/17
Paper # SCE2000-40
Volume (vol) vol.100
Number (no) 572
Page pp.pp.-
#Pages 6
Date of Issue