Presentation 2001/1/17
Fabrication of c-axis Oriented YBaCuO Trilayer Junction with Ar Plasma Treatment
Takahiro Kaneda, Toshikazu Yamada, Hiroshi Sato, Hiroshi Yamamoto, Hiroshi Akoh,
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Abstract(in English) We have fabricated c-axis oriented YBaCuO/PrBaCuO/YBaCuO trilayer junctions with Ar plasma treatment for the base YBaCuO films. The junctions showed RSJ-like current-voltage characteristics, and a modulation of critical current by external magnetic field. The junctions with Ar plasma treatment have a larger Josephson critical current density J_c of 1.6kA/cm^2, compared to the junction without Ar plasma treatment with J_c of 670A/cm^2. It is suggested that the Ar plasma treatment can be used to improve the junction properties. We have also reported the preliminary result of YBaCuO trilayer junction with ECR-plasma-treatment barriers, which showed the small, however, Josephson effect.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Ar plasma treatment / c-axis orientation / Josephson junction / YBaCuO trilayer junction
Paper # SCE2000-38
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Committee SCE
Conference Date 2001/1/17(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fabrication of c-axis Oriented YBaCuO Trilayer Junction with Ar Plasma Treatment
Sub Title (in English)
Keyword(1) Ar plasma treatment
Keyword(2) c-axis orientation
Keyword(3) Josephson junction
Keyword(4) YBaCuO trilayer junction
1st Author's Name Takahiro Kaneda
1st Author's Affiliation Nihon university()
2nd Author's Name Toshikazu Yamada
2nd Author's Affiliation National Institute for Advanced Interdisciplinary Research
3rd Author's Name Hiroshi Sato
3rd Author's Affiliation Electrotechnical Laboratory
4th Author's Name Hiroshi Yamamoto
4th Author's Affiliation Nihon university
5th Author's Name Hiroshi Akoh
5th Author's Affiliation Electrotechnical Laboratory
Date 2001/1/17
Paper # SCE2000-38
Volume (vol) vol.100
Number (no) 572
Page pp.pp.-
#Pages 6
Date of Issue