| Presentation | 2000/10/20 Measurement of Surface Resistance of Large Area Superconducting Films M Kusunoki, M Mukaida, S Ohshima, Lorenz M, Hochmuth H, Natusch D, Tahrigen T, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Experimental errors in the measurement of surface resistance(R_s)of superconductor using the dielectric resonator are discussed. Thermal contract of the dielectric, loss tangent of the dielectric, and the amount of scatter of several measurements in the resonance frequency and the quality factor are investigated. The R_s values of the 3-inch YBa_2Cu_3O_y films are measured using 3 kind of sapphires that have different diameter(3.8, 5.8, 9.5 GHz). Scaled R_s to 10 GHz is almost the same in a film with uniform critical density(J.C). On the other hand, differen R_S values that correspond to the J_c distribution are observed in the film that has lack of uniformity in J_c. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | dielectric resonator / surface resistance / error / loss tangent / 3-inch YBa-2Cu_3O_y / critical current density |
| Paper # | SCE2000-36 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2000/10/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Measurement of Surface Resistance of Large Area Superconducting Films |
| Sub Title (in English) | |
| Keyword(1) | dielectric resonator |
| Keyword(2) | surface resistance |
| Keyword(3) | error |
| Keyword(4) | loss tangent |
| Keyword(5) | 3-inch YBa-2Cu_3O_y |
| Keyword(6) | critical current density |
| 1st Author's Name | M Kusunoki |
| 1st Author's Affiliation | Department of Electrical Engineering, Yamagata University() |
| 2nd Author's Name | M Mukaida |
| 2nd Author's Affiliation | Department of Electrical Engineering, Yamagata University |
| 3rd Author's Name | S Ohshima |
| 3rd Author's Affiliation | Department of Electrical Engineering, Yamagata University |
| 4th Author's Name | Lorenz M |
| 4th Author's Affiliation | Universitaet Leipzig, Fakultaet fuer Physik und Geowissenschaften, Institut fuer Experimentelle Physik II |
| 5th Author's Name | Hochmuth H |
| 5th Author's Affiliation | Universitaet Leipzig, Fakultaet fuer Physik und Geowissenschaften, Institut fuer Experimentelle Physik II |
| 6th Author's Name | Natusch D |
| 6th Author's Affiliation | Universitaet Leipzig, Fakultaet fuer Physik und Geowissenschaften, Institut fuer Experimentelle Physik II |
| 7th Author's Name | Tahrigen T |
| 7th Author's Affiliation | Universitaet Leipzig, Fakultaet fuer Physik und Geowissenschaften, Institut fuer Experimentelle Physik II |
| Date | 2000/10/20 |
| Paper # | SCE2000-36 |
| Volume (vol) | vol.100 |
| Number (no) | 399 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |