Presentation 2000/10/20
Transport Properties of Small-Sized Intrinsic Josephson Junctions
A Irie, G Oya,
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Abstract(in English) Transport properties of small-sized intrinsic josephson in Bi_2Sr_2CaCu_2O_y have been systematically investigated with respect to both junction size and temperature. Using electron-beam lithography, we have successfully fabricated mesas with lateral dimensions ranging from sub-μm^2 to several tens μm^2 on the same crystal. The fabricated mesas showed typical multiple resistive branches with hysteresis and well defined gap structures in the I-V characteristics. In addition, the suppression of the critical current densities for mesas with dimensions less that 1 μm^2 were observed. Such decrease in J_c was interpreted in terms of the contribution of the Coulomb blockade effect.
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Keyword(in English) Bi_2Sr_2CaCu_2O_y / electron-beam lithography / sub-μm^2 / critical current density / Coulomb blockade effect
Paper # SCE2000-28
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Committee SCE
Conference Date 2000/10/20(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Transport Properties of Small-Sized Intrinsic Josephson Junctions
Sub Title (in English)
Keyword(1) Bi_2Sr_2CaCu_2O_y
Keyword(2) electron-beam lithography
Keyword(3) sub-μm^2
Keyword(4) critical current density
Keyword(5) Coulomb blockade effect
1st Author's Name A Irie
1st Author's Affiliation Utsunomiya University and CREST, Japan Science and Technology Corporation(JST)()
2nd Author's Name G Oya
2nd Author's Affiliation Utsunomiya University and CREST, Japan Science and Technology Corporation(JST)
Date 2000/10/20
Paper # SCE2000-28
Volume (vol) vol.100
Number (no) 399
Page pp.pp.-
#Pages 6
Date of Issue