Presentation 2000/8/22
SCE2000-27 / MW2000-91 Complex permittivity measurement at 77 GHz, using dielectric rod resonator excited by NRD Guide
Akira Nakayam, Atsuomi Fukuura, Michiaki Nishimura,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) A millimeter wave measurement method of complex permittivity and effective conductivity by dielectric resonator excited by NRD-guide was extended to 77 GHz measurements. The complex permittivity was obtained by resonance frequency and unloaded Q value of TE_<0ml> mode resonator. The effective conductivity was determined by the difference of unloaded Q values of TE_<0ml> and TE_<0mδ> mode resonators. Values of the complex permittivity of sapphire, codierite and Ba(Mg_1/2W_1/2)O_3, with effective conductivity of Cu plate, were measured by the new method. Furthermore, frequency dependence of complex permittivity of sapphire was measured in the frequency range from 10 to 77 Ghz.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Millimeter wave / Complex permittivity measurement / NRD-guide / Dielectric resonator
Paper # SCE2000-27,MW2000-91
Date of Issue

Conference Information
Committee SCE
Conference Date 2000/8/22(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) SCE2000-27 / MW2000-91 Complex permittivity measurement at 77 GHz, using dielectric rod resonator excited by NRD Guide
Sub Title (in English)
Keyword(1) Millimeter wave
Keyword(2) Complex permittivity measurement
Keyword(3) NRD-guide
Keyword(4) Dielectric resonator
1st Author's Name Akira Nakayam
1st Author's Affiliation R&D Center Kagoshima, Kyocera Corporation()
2nd Author's Name Atsuomi Fukuura
2nd Author's Affiliation R&D Center Kagoshima, Kyocera Corporation
3rd Author's Name Michiaki Nishimura
3rd Author's Affiliation R&D Center Kagoshima, Kyocera Corporation
Date 2000/8/22
Paper # SCE2000-27,MW2000-91
Volume (vol) vol.100
Number (no) 274
Page pp.pp.-
#Pages 7
Date of Issue