| Presentation | 2000/1/26 1/f noise properties in Nb/Al+AlO_x, constrictions/Nb devices N. Sato, A. Saito, A. Kawakami, Z. Wang, M. Tanaka, S. Tahara, K. Hamasaki, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have measured the 1/f noise in Nb/Al-AlO_x/Nb and Nb/constrictions/Nb junctions as a function of bias voltage. The 1/f noise parameter η of these superconducting weak link devices strongly depends on the device quality factor Q. Using the Blonder, Tinkham and Klapwijk (BTK) theory we give a simple relationship between the Q value and the Andreev reflection probability A(E). Within the framework of this single-Andreev reflection model, we found that the weak link devices exhibit low 1/f noise with a parameter η that scales approximately as η∝A(E)(1-A(E)). |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | 1/f noise / superconducting weak link device / Andreev reflection probability |
| Paper # | SCE99-39 |
| Date of Issue |
| Conference Information | |
| Committee | SCE |
|---|---|
| Conference Date | 2000/1/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | 1/f noise properties in Nb/Al+AlO_x, constrictions/Nb devices |
| Sub Title (in English) | |
| Keyword(1) | 1/f noise |
| Keyword(2) | superconducting weak link device |
| Keyword(3) | Andreev reflection probability |
| 1st Author's Name | N. Sato |
| 1st Author's Affiliation | Department of Electrical Engineering, Nagaoka University of Technology() |
| 2nd Author's Name | A. Saito |
| 2nd Author's Affiliation | Department of Electrical Engineering, Nagaoka University of Technology |
| 3rd Author's Name | A. Kawakami |
| 3rd Author's Affiliation | KARC Communications Research Laboratory |
| 4th Author's Name | Z. Wang |
| 4th Author's Affiliation | KARC Communications Research Laboratory |
| 5th Author's Name | M. Tanaka |
| 5th Author's Affiliation | Fundamental Research Laboratories, NEC Corporation |
| 6th Author's Name | S. Tahara |
| 6th Author's Affiliation | Fundamental Research Laboratories, NEC Corporation |
| 7th Author's Name | K. Hamasaki |
| 7th Author's Affiliation | Department of Electrical Engineering, Nagaoka University of Technology |
| Date | 2000/1/26 |
| Paper # | SCE99-39 |
| Volume (vol) | vol.99 |
| Number (no) | 586 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |