Presentation 1999/7/30
Ac bias readout schemes for high-T_c dc-SQUIDs
Amane Hayashi, Hiroshi Oyama, Satoru Hirano, Shinya Kuriki,
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Abstract(in English) Ac current-bias method is used in the readout system of dc-SQUIDs to suppress the low-frequency noise that originates in the fluctuation of parameters of two junctions in the SQUID. From the analysis of various schemes of the ac bias method, we propose a simple form which expresses the alternation of the operation variables, I.e., bias current, modulation flux, and bias flux. We considered the modification of the previous schemes in the context of this form, and found a possibility to detect exclusively the noise component due to the parameter fluctuation. In the modified ac bias scheme, the low-frequency noise of the parameter fluctuation can either be detected or suppressed by manipulating a single variable. We fabricated the electronics to verify this function, and confirmed the versatility of this method from the measurements of high-T_c SQUID.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SQUID / ac bias / high-T_c SQUID / superconducting device / low-frequency noise
Paper # SCE99-20
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Committee SCE
Conference Date 1999/7/30(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Ac bias readout schemes for high-T_c dc-SQUIDs
Sub Title (in English)
Keyword(1) SQUID
Keyword(2) ac bias
Keyword(3) high-T_c SQUID
Keyword(4) superconducting device
Keyword(5) low-frequency noise
1st Author's Name Amane Hayashi
1st Author's Affiliation Research Institute for Electronic Science Hokkaido University()
2nd Author's Name Hiroshi Oyama
2nd Author's Affiliation Research Institute for Electronic Science Hokkaido University
3rd Author's Name Satoru Hirano
3rd Author's Affiliation Research Institute for Electronic Science Hokkaido University
4th Author's Name Shinya Kuriki
4th Author's Affiliation Research Institute for Electronic Science Hokkaido University
Date 1999/7/30
Paper # SCE99-20
Volume (vol) vol.99
Number (no) 249
Page pp.pp.-
#Pages 6
Date of Issue