| Presentation | 1999/7/30 Direct Flux Noise Measurement of Superconducting Thin Film Devices S. Hirano, H. Oyama, Y. Hirata, M. Matsuda, T. Morooka, S. Nakayama, S. Kuriki, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to study the vortex dynamics in high-Tc and low-Tc superconducting thin film devices, we investigated the flux noise by the direct flux detection method of YBa_2Cu_3O_<7-δ> (YBCO) grain boundary junctions (misorientation angle 36.8゜, thickness 300 nm, width 27μm) and a short variable-thickness-bridge (VTB) on an epitaxial Nb film (length 100 nm) made by focused-ion-beam (FIB) technique. For the YBCO sample, the flux noise at about 70 K was very sensitive to the history of the cooling process of the sample. However, random telegraph noise (RTN) with a step height of 0.6φ_0 was observed at 69K. For the Nb VTB, multiple step noise (MSN) with a step height of 0.1φ_0 was observed at 5.89K above the critical current. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Direct flux detection method / YBa_2Cu_3O_<7-δ> (YBCO) grain boundary junction / epitaxial Nb thin film / variable-thickness-bridge / random telegraph noise / multiple step noise |
| Paper # | SCE99-19 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 1999/7/30(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Direct Flux Noise Measurement of Superconducting Thin Film Devices |
| Sub Title (in English) | |
| Keyword(1) | Direct flux detection method |
| Keyword(2) | YBa_2Cu_3O_<7-δ> (YBCO) grain boundary junction |
| Keyword(3) | epitaxial Nb thin film |
| Keyword(4) | variable-thickness-bridge |
| Keyword(5) | random telegraph noise |
| Keyword(6) | multiple step noise |
| 1st Author's Name | S. Hirano |
| 1st Author's Affiliation | Research Institute for Electronic Science, Hokkaido University() |
| 2nd Author's Name | H. Oyama |
| 2nd Author's Affiliation | Research Institute for Electronic Science, Hokkaido University |
| 3rd Author's Name | Y. Hirata |
| 3rd Author's Affiliation | Research Institute for Electronic Science, Hokkaido University |
| 4th Author's Name | M. Matsuda |
| 4th Author's Affiliation | Muroran Institute of Technology |
| 5th Author's Name | T. Morooka |
| 5th Author's Affiliation | Seiko Instruments Inc. |
| 6th Author's Name | S. Nakayama |
| 6th Author's Affiliation | Seiko Instruments Inc. |
| 7th Author's Name | S. Kuriki |
| 7th Author's Affiliation | Research Institute for Electronic Science, Hokkaido University |
| Date | 1999/7/30 |
| Paper # | SCE99-19 |
| Volume (vol) | vol.99 |
| Number (no) | 249 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |