Presentation 1994/12/14
Fabrication of Nb/Al-AlOx-Al/Ta/Nb Josephson Junction for X-ray detection
Shin'ichi Morohashi, Naoki Yokoyama,
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Abstract(in English) We have fabricated Nb, Al-AlOx-Al/Ta/Nb Josephson junctions for use as energy resolving X-ray detectors.The junctions have been designed to raise both creation and collection efficiency of quasiparticles.We have investigated the current-voltage characteristics of the junctions on the Al deposition dependence, and found that the characteristics are strongly dependent on the Al deposition rate during the fabrication.The sub-gap leakage current of those junctions fabricated at higher Al deposition rates exhibit very low leakage current(less than 200nA at a bias voltage of 100μV measured at 0.5K).
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Superconducting X-ray detector / Josephson Junction / Tunneling Barrier / Semiconductor X-ray detector
Paper # SCE94-42,CPM94-97
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Committee SCE
Conference Date 1994/12/14(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fabrication of Nb/Al-AlOx-Al/Ta/Nb Josephson Junction for X-ray detection
Sub Title (in English)
Keyword(1) Superconducting X-ray detector
Keyword(2) Josephson Junction
Keyword(3) Tunneling Barrier
Keyword(4) Semiconductor X-ray detector
1st Author's Name Shin'ichi Morohashi
1st Author's Affiliation Fujitsu Laboratories LTD.()
2nd Author's Name Naoki Yokoyama
2nd Author's Affiliation Fujitsu Laboratories LTD.
Date 1994/12/14
Paper # SCE94-42,CPM94-97
Volume (vol) vol.94
Number (no) 393
Page pp.pp.-
#Pages 6
Date of Issue