Presentation | 1994/12/14 Fabrication of Nb/Al-AlOx-Al/Ta/Nb Josephson Junction for X-ray detection Shin'ichi Morohashi, Naoki Yokoyama, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have fabricated Nb, Al-AlOx-Al/Ta/Nb Josephson junctions for use as energy resolving X-ray detectors.The junctions have been designed to raise both creation and collection efficiency of quasiparticles.We have investigated the current-voltage characteristics of the junctions on the Al deposition dependence, and found that the characteristics are strongly dependent on the Al deposition rate during the fabrication.The sub-gap leakage current of those junctions fabricated at higher Al deposition rates exhibit very low leakage current(less than 200nA at a bias voltage of 100μV measured at 0.5K). |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Superconducting X-ray detector / Josephson Junction / Tunneling Barrier / Semiconductor X-ray detector |
Paper # | SCE94-42,CPM94-97 |
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Conference Information | |
Committee | SCE |
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Conference Date | 1994/12/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fabrication of Nb/Al-AlOx-Al/Ta/Nb Josephson Junction for X-ray detection |
Sub Title (in English) | |
Keyword(1) | Superconducting X-ray detector |
Keyword(2) | Josephson Junction |
Keyword(3) | Tunneling Barrier |
Keyword(4) | Semiconductor X-ray detector |
1st Author's Name | Shin'ichi Morohashi |
1st Author's Affiliation | Fujitsu Laboratories LTD.() |
2nd Author's Name | Naoki Yokoyama |
2nd Author's Affiliation | Fujitsu Laboratories LTD. |
Date | 1994/12/14 |
Paper # | SCE94-42,CPM94-97 |
Volume (vol) | vol.94 |
Number (no) | 393 |
Page | pp.pp.- |
#Pages | 6 |
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