Presentation 1994/7/20
The influence of the surface barrier to flux entry on I-V characteristics for a superconducting flux flow transistor
Hiroya Andoh, Masanobu Kusunoki, Akira Fujimaki, Hisao Hayakawa,
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Abstract(in English) The nonlinearity can be found in 1-V caracteristics for some superconducting flux transistors.It is interesting to fund the nonlinearity for the sample using high quality films.There may be some flux creep mechanism without a flux pinning.We studied the influence of the surface barrier to flux entry on 1-V characteristics for a superconducting flux flow transistor using numerical calculation.And it was found that the surface barrier play an important role in the nomlinearity of 1-V characteristics for flux flow transistors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) flux flow transistor / surface barrier / superconducting narrow line / numerical calculation / flux creep / critical current density
Paper # SCE94-23
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Committee SCE
Conference Date 1994/7/20(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The influence of the surface barrier to flux entry on I-V characteristics for a superconducting flux flow transistor
Sub Title (in English)
Keyword(1) flux flow transistor
Keyword(2) surface barrier
Keyword(3) superconducting narrow line
Keyword(4) numerical calculation
Keyword(5) flux creep
Keyword(6) critical current density
1st Author's Name Hiroya Andoh
1st Author's Affiliation Toyota National College of Technology()
2nd Author's Name Masanobu Kusunoki
2nd Author's Affiliation Faculty of Engineering,Nagoya University
3rd Author's Name Akira Fujimaki
3rd Author's Affiliation Faculty of Engineering,Nagoya University
4th Author's Name Hisao Hayakawa
4th Author's Affiliation Faculty of Engineering,Nagoya University
Date 1994/7/20
Paper # SCE94-23
Volume (vol) vol.94
Number (no) 156
Page pp.pp.-
#Pages 6
Date of Issue