Presentation 1998/11/16
Analysis of the vortex dynamics of Nb variable-thickness-bridges measured by direct flux detection method
S. Hirano, Y. Hirata, M. Matsuda, T. Morooka, S. Nakayama, S. Kuriki,
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Abstract(in English) In order to study the dynamics of vortices moving in superconducting thin film devices, we constructed the direct flux detection probe using a concentric thin film planar gradiometer. Measurements of static V-I and flux noise characteristics were made of variable-thickness-bridge (VTB) made on epitaxial Nb film. The critical current Ic was detemined as the onset of vortex motion and multiple step noise was observed above the Ic. The minimum step height corresponded to a single vortex motion. It is suggested that the multiple step noise is generated by successive entries of single vortices into the bridge. Based on the picture obtained from the measurements, analysis on the vortex dynamics was given using a simple gas flow model.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Direct flux detection method / epitaxial Nb thin film / variable-thickness-bridge (VTB) / magnetic flux noise
Paper # SCE98-29
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Committee SCE
Conference Date 1998/11/16(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of the vortex dynamics of Nb variable-thickness-bridges measured by direct flux detection method
Sub Title (in English)
Keyword(1) Direct flux detection method
Keyword(2) epitaxial Nb thin film
Keyword(3) variable-thickness-bridge (VTB)
Keyword(4) magnetic flux noise
1st Author's Name S. Hirano
1st Author's Affiliation Research Institute for Electronic Sciences, Hokkaido University()
2nd Author's Name Y. Hirata
2nd Author's Affiliation Research Institute for Electronic Sciences, Hokkaido University
3rd Author's Name M. Matsuda
3rd Author's Affiliation Muroran Institute of Technology
4th Author's Name T. Morooka
4th Author's Affiliation Seiko Instruments Inc.
5th Author's Name S. Nakayama
5th Author's Affiliation Seiko Instruments Inc.
6th Author's Name S. Kuriki
6th Author's Affiliation Research Institute for Electronic Sciences, Hokkaido University
Date 1998/11/16
Paper # SCE98-29
Volume (vol) vol.98
Number (no) 399
Page pp.pp.-
#Pages 6
Date of Issue