Presentation | 1998/11/16 Analysis of the vortex dynamics of Nb variable-thickness-bridges measured by direct flux detection method S. Hirano, Y. Hirata, M. Matsuda, T. Morooka, S. Nakayama, S. Kuriki, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In order to study the dynamics of vortices moving in superconducting thin film devices, we constructed the direct flux detection probe using a concentric thin film planar gradiometer. Measurements of static V-I and flux noise characteristics were made of variable-thickness-bridge (VTB) made on epitaxial Nb film. The critical current Ic was detemined as the onset of vortex motion and multiple step noise was observed above the Ic. The minimum step height corresponded to a single vortex motion. It is suggested that the multiple step noise is generated by successive entries of single vortices into the bridge. Based on the picture obtained from the measurements, analysis on the vortex dynamics was given using a simple gas flow model. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Direct flux detection method / epitaxial Nb thin film / variable-thickness-bridge (VTB) / magnetic flux noise |
Paper # | SCE98-29 |
Date of Issue |
Conference Information | |
Committee | SCE |
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Conference Date | 1998/11/16(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of the vortex dynamics of Nb variable-thickness-bridges measured by direct flux detection method |
Sub Title (in English) | |
Keyword(1) | Direct flux detection method |
Keyword(2) | epitaxial Nb thin film |
Keyword(3) | variable-thickness-bridge (VTB) |
Keyword(4) | magnetic flux noise |
1st Author's Name | S. Hirano |
1st Author's Affiliation | Research Institute for Electronic Sciences, Hokkaido University() |
2nd Author's Name | Y. Hirata |
2nd Author's Affiliation | Research Institute for Electronic Sciences, Hokkaido University |
3rd Author's Name | M. Matsuda |
3rd Author's Affiliation | Muroran Institute of Technology |
4th Author's Name | T. Morooka |
4th Author's Affiliation | Seiko Instruments Inc. |
5th Author's Name | S. Nakayama |
5th Author's Affiliation | Seiko Instruments Inc. |
6th Author's Name | S. Kuriki |
6th Author's Affiliation | Research Institute for Electronic Sciences, Hokkaido University |
Date | 1998/11/16 |
Paper # | SCE98-29 |
Volume (vol) | vol.98 |
Number (no) | 399 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |