Presentation | 1999/1/27 c-axis-oriented YBCO / PBCO / YBCO stacked junctions using interface engineering M. Maruyama, K. Yoshida, A. Fujimaki, H. Hayakawa, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have investigated the effectas of an annealing at interfaces on the junction properties in c-axis-oriented YBCO/PBCO/ YBCO stacked structure. The junctions made through the annealing of the base-YBCO surface at 720℃ and 40 Pa showed RSJ-like current-voltage characteristics with clear hysteresis, though the thickness of PBCO was as thin as 20 nm. The supercurrent contained little excess current even at low temperatures. The critical current exhibited Fraunhofer-like magnetic field diffraction pattern with the modulation depth more than 90%. The obtained IcRn product was 1.4mV at 4.2K, which remarkably increased compared to the conventional junctions without the annealing. The fact that the conventional junctions with 20nm-thick PBCO did not show RSJ-like characteristics because of electrical shorts between both electrodes indicates the annealing of the base-YBCO surface plays an important role in the formation of more uniform barriers without leakage passes. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | interface engineering / YBCO / PBCO / YBCO / stacked junction / c-axis-oriented film |
Paper # | SCE98-42 |
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Conference Information | |
Committee | SCE |
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Conference Date | 1999/1/27(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | c-axis-oriented YBCO / PBCO / YBCO stacked junctions using interface engineering |
Sub Title (in English) | |
Keyword(1) | interface engineering |
Keyword(2) | YBCO |
Keyword(3) | PBCO |
Keyword(4) | YBCO |
Keyword(5) | stacked junction |
Keyword(6) | c-axis-oriented film |
1st Author's Name | M. Maruyama |
1st Author's Affiliation | Department of Quantum Engineerign, Nagoya University() |
2nd Author's Name | K. Yoshida |
2nd Author's Affiliation | Department of Quantum Engineerign, Nagoya University |
3rd Author's Name | A. Fujimaki |
3rd Author's Affiliation | Department of Quantum Engineerign, Nagoya University |
4th Author's Name | H. Hayakawa |
4th Author's Affiliation | Department of Quantum Engineerign, Nagoya University |
Date | 1999/1/27 |
Paper # | SCE98-42 |
Volume (vol) | vol.98 |
Number (no) | 564 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |