Presentation | 1998/4/22 Measurement of the surface resistance and the magnetic penetration depth by the microstripline resonato method ; Examination of effect of the thin film thickness on measurement accuracy of Rs and λ Daisuke Okai, Takafumi Tomiyama, Yoko Shinkai, Masanobu Kusunoki, Shigetoshi Ohshima, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Using the microstripline resonator method, we can measure all of the values of the surface resistance. Rs and magnetic penetration depth, λ of superconducting thin film and the dielectric constant, ε_r and dielectric loss, tan δ of dielectric substrate, which are important parameters for designing superconducting microwave passive devices. However, the microstripline resonator method for accurate measurement of the values of the Rs and the λ has not yet been examined systematically. We investigated the effect of the thin film thickness on accuracy of the values of the Rs and the λ. The results show that in order to increase the accuracy of the Rs and the λ, we must take into consideration the thickness of the stripline. The Rs λ of YBCO thin film were measured using the microstripline resonator method. The Rs was 177.2μΩ at 3.9 GHz and at 21K, and the λ(0) was found out to be 0.37μm. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | microstripline resonator / surface resistance / magnetic penetration depth |
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Committee | SCE |
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Conference Date | 1998/4/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Measurement of the surface resistance and the magnetic penetration depth by the microstripline resonato method ; Examination of effect of the thin film thickness on measurement accuracy of Rs and λ |
Sub Title (in English) | |
Keyword(1) | microstripline resonator |
Keyword(2) | surface resistance |
Keyword(3) | magnetic penetration depth |
1st Author's Name | Daisuke Okai |
1st Author's Affiliation | Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University() |
2nd Author's Name | Takafumi Tomiyama |
2nd Author's Affiliation | Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University |
3rd Author's Name | Yoko Shinkai |
3rd Author's Affiliation | Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University |
4th Author's Name | Masanobu Kusunoki |
4th Author's Affiliation | Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University |
5th Author's Name | Shigetoshi Ohshima |
5th Author's Affiliation | Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University |
Date | 1998/4/22 |
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Volume (vol) | vol.98 |
Number (no) | 14 |
Page | pp.pp.- |
#Pages | 8 |
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