Presentation 1998/4/22
Measurement of the surface resistance and the magnetic penetration depth by the microstripline resonato method ; Examination of effect of the thin film thickness on measurement accuracy of Rs and λ
Daisuke Okai, Takafumi Tomiyama, Yoko Shinkai, Masanobu Kusunoki, Shigetoshi Ohshima,
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Abstract(in English) Using the microstripline resonator method, we can measure all of the values of the surface resistance. Rs and magnetic penetration depth, λ of superconducting thin film and the dielectric constant, ε_r and dielectric loss, tan δ of dielectric substrate, which are important parameters for designing superconducting microwave passive devices. However, the microstripline resonator method for accurate measurement of the values of the Rs and the λ has not yet been examined systematically. We investigated the effect of the thin film thickness on accuracy of the values of the Rs and the λ. The results show that in order to increase the accuracy of the Rs and the λ, we must take into consideration the thickness of the stripline. The Rs λ of YBCO thin film were measured using the microstripline resonator method. The Rs was 177.2μΩ at 3.9 GHz and at 21K, and the λ(0) was found out to be 0.37μm.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) microstripline resonator / surface resistance / magnetic penetration depth
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Conference Information
Committee SCE
Conference Date 1998/4/22(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of the surface resistance and the magnetic penetration depth by the microstripline resonato method ; Examination of effect of the thin film thickness on measurement accuracy of Rs and λ
Sub Title (in English)
Keyword(1) microstripline resonator
Keyword(2) surface resistance
Keyword(3) magnetic penetration depth
1st Author's Name Daisuke Okai
1st Author's Affiliation Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University()
2nd Author's Name Takafumi Tomiyama
2nd Author's Affiliation Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University
3rd Author's Name Yoko Shinkai
3rd Author's Affiliation Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University
4th Author's Name Masanobu Kusunoki
4th Author's Affiliation Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University
5th Author's Name Shigetoshi Ohshima
5th Author's Affiliation Department of Electrical and Information Engineering, Faculty of Engineering, Ymagarta University
Date 1998/4/22
Paper #
Volume (vol) vol.98
Number (no) 14
Page pp.pp.-
#Pages 8
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