Presentation 1998/4/22
Discussion for measurement precisions of surface resistance of superconductor plates and films by dielectric resonator menthods
Shingo Okajima, Hiromichi Yoshikawa, Yoshio Kobarashi,
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Abstract(in English) For microwave measurement of surface resistance R_s of superconductors, measurement precisions are discussed for dielectric resonator methods of two types; one called one-resonator method, uses TE_<012> and a TE_<021> modes of a dilectric resonator and the other called two-resonator method, uses a TE_<011> resonator and a TE_<013> resonator. At first, ratios S=d/D required for R_s measurements, where d is diameter of superconductor plates and D is diameter of a dielectric rod, are calculated for sapphire with the relative permitivity ε_r=9.7 and for BMT ceramics with ε_r=24. Similarly, effects of 1% precision in the Q measurements on the R_s precision are discussed.
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Keyword(in English) superconductors / microwave / surface resistance
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Committee SCE
Conference Date 1998/4/22(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Discussion for measurement precisions of surface resistance of superconductor plates and films by dielectric resonator menthods
Sub Title (in English)
Keyword(1) superconductors
Keyword(2) microwave
Keyword(3) surface resistance
1st Author's Name Shingo Okajima
1st Author's Affiliation Faculy of Engineering, Saitama University()
2nd Author's Name Hiromichi Yoshikawa
2nd Author's Affiliation Faculy of Engineering, Saitama University
3rd Author's Name Yoshio Kobarashi
3rd Author's Affiliation Faculy of Engineering, Saitama University
Date 1998/4/22
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Volume (vol) vol.98
Number (no) 14
Page pp.pp.-
#Pages 6
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