Presentation 1993/10/20
Effect of thermal noise on the characteristics of high Tc superconducting quantum interference device(II)
Keiji Enpuku, Hideki Doi, Go Tokita,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Effect of thermal noise on the voltage versus flux(V-Φ))relation of dc superconducting quantum interference devices(SQUIDs)is studied.A theoretical expression for the modulation voltage ΔV in the V-Φ relation is presented as a fnction of SQUID inductance.Tne theoretical expression is compared with experimental results of Δ V reported recently for high Tc SQUIDs with different inductances. It is shown that experimental results agree quanbitatively with theoretical ones.It is also shown that imperfection of Josephson junctions degrades the modulation voltage more significantly when the inductance increases.Finally,a new SQUID using three junctions is proposed in order to prevent degradation of the modulation voltage due to thermal noise.Numerical simulation shows the usefulness of the new SQUID,especially for the case of large inductances.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SQUID / high Tc Super conductor / thermal noise / V-Φ relation / modulation voltage
Paper # SCE93-42
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Conference Information
Committee SCE
Conference Date 1993/10/20(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Effect of thermal noise on the characteristics of high Tc superconducting quantum interference device(II)
Sub Title (in English)
Keyword(1) SQUID
Keyword(2) high Tc Super conductor
Keyword(3) thermal noise
Keyword(4) V-Φ relation
Keyword(5) modulation voltage
1st Author's Name Keiji Enpuku
1st Author's Affiliation Department of Electronics,Faculty of Engineering,Kyushu University()
2nd Author's Name Hideki Doi
2nd Author's Affiliation Department of Electronics,Faculty of Engineering,Kyushu University
3rd Author's Name Go Tokita
3rd Author's Affiliation Department of Electronics,Faculty of Engineering,Kyushu University
Date 1993/10/20
Paper # SCE93-42
Volume (vol) vol.93
Number (no) 279
Page pp.pp.-
#Pages 6
Date of Issue