Presentation 1993/10/20
Fabrication of Josephson Junctions with Al/Ta/Nb structure for X- ray detection
Shin'ichi Morohashi, Kohtaroh Gotoh, Satoshi Komiya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have fabricated Josephson junctions with Al, Ta/Nb structure for X-ray detection.We have selected a Ta layer to be absorber for quasiparticles generated by an incident X-ray to the junction because of having a long life time of quasiparticles and a high absorption efficiency for X-ray.A Nb layer has served as not only the barrier for quasiparticle rejection,but also the buffer layer for making a body cubic centered Ta layer.An Al layer has been selected for not only the formation of AlOx barrier,but also the trapping layer of quasiparticles.Fabricated junctions have shown excellent current-voltage characteristics at 0.4 K.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Josephson Junction X-ray detection / Quasiparticle trapping / Quasiparticle rejection / Absorption for X-ray
Paper # SCE93-38
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Committee SCE
Conference Date 1993/10/20(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fabrication of Josephson Junctions with Al/Ta/Nb structure for X- ray detection
Sub Title (in English)
Keyword(1) Josephson Junction X-ray detection
Keyword(2) Quasiparticle trapping
Keyword(3) Quasiparticle rejection
Keyword(4) Absorption for X-ray
1st Author's Name Shin'ichi Morohashi
1st Author's Affiliation Fujitsu Laboratories Ltd.()
2nd Author's Name Kohtaroh Gotoh
2nd Author's Affiliation Fujitsu Laboratories Ltd.
3rd Author's Name Satoshi Komiya
3rd Author's Affiliation Fujitsu Laboratories Ltd.
Date 1993/10/20
Paper # SCE93-38
Volume (vol) vol.93
Number (no) 279
Page pp.pp.-
#Pages 6
Date of Issue