Presentation 1993/10/20
Numerical Simulation of Dynamic Characteristics of Logic Circuits using a Single Electron Transistor
Kimiyasu Tanaka, Nobuyuki Yoshikawa, Masanori Sugahara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Dynamic characteristics of inverter circuits using single electron transistors with capacitive coupling are numerically calculated by the Monte Carlo method.It is found from input-output voltage transfer characteristics that a voltage gain can be larger than unity.But a waveform of the output is very oscillatory function of the time due to stochastic tunneling events of a electron in the SET transistor,which seems to cause some problems in realizing the logic circuits.We show that the output capacitance stabilizes the voltage oscillation,but it lowers the voltage gain and reduces the operating speed.Furthermore,we investigate the dynamic characteristics of a chain of two SET inverters,and show that it also has the voltage gain larger than unity.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Coulomb blockade / single-electron-tunneling effect / SET transistor / inverter
Paper # SCE93-32
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Committee SCE
Conference Date 1993/10/20(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Numerical Simulation of Dynamic Characteristics of Logic Circuits using a Single Electron Transistor
Sub Title (in English)
Keyword(1) Coulomb blockade
Keyword(2) single-electron-tunneling effect
Keyword(3) SET transistor
Keyword(4) inverter
1st Author's Name Kimiyasu Tanaka
1st Author's Affiliation Division of electrical and computer engineering,Faculty of engineering Yokohama national University()
2nd Author's Name Nobuyuki Yoshikawa
2nd Author's Affiliation Division of electrical and computer engineering,Faculty of engineering Yokohama national University
3rd Author's Name Masanori Sugahara
3rd Author's Affiliation Division of electrical and computer engineering,Faculty of engineering Yokohama national University
Date 1993/10/20
Paper # SCE93-32
Volume (vol) vol.93
Number (no) 279
Page pp.pp.-
#Pages 6
Date of Issue