Presentation 1993/10/20
Electron conduction properties of one dimentional array of SET junctions and influence of inhomogeneity
Kazuhiro Fukushima, Nobuyuki Yoshikawa, Masanori Sugahara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Simulation calculation is made on the frequency spectrum of the coherent voltage oscillations of correlated single electron tunneling in long one dimensional array of small tunnel junctions based on the semiclassical picture.The line width of the frequency spectrum tends to be sharp in a certain frequency region depending on a ratio Cs, C,where C and Cs are the junction capacitance and the shunt capacitance respectively.It is found that the relation between the size of the charge solitons and the distance of solitons in the array determines the line width of the spectrum. Moreover,we have investigated the influence of inhomogeneity of junction parameters on the line width of the spectrum.It is found that the coherency of the oscillation is deteriorated seriously by inhomogeneity of the fixed charges on the metal electrodes,whereas it is not so disturbed by inhomogeneity of the junction parameters such as the junction capacitance and the conductance.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SET oscillation / coulomb blockade / time correlation / frequency spectrum / charge soliton
Paper # SCE93-31
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Conference Information
Committee SCE
Conference Date 1993/10/20(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electron conduction properties of one dimentional array of SET junctions and influence of inhomogeneity
Sub Title (in English)
Keyword(1) SET oscillation
Keyword(2) coulomb blockade
Keyword(3) time correlation
Keyword(4) frequency spectrum
Keyword(5) charge soliton
1st Author's Name Kazuhiro Fukushima
1st Author's Affiliation Division of electrical and computer engineering,Faculty of engineering,Yokohama national university()
2nd Author's Name Nobuyuki Yoshikawa
2nd Author's Affiliation Division of electrical and computer engineering,Faculty of engineering,Yokohama national university
3rd Author's Name Masanori Sugahara
3rd Author's Affiliation Division of electrical and computer engineering,Faculty of engineering,Yokohama national university
Date 1993/10/20
Paper # SCE93-31
Volume (vol) vol.93
Number (no) 279
Page pp.pp.-
#Pages 6
Date of Issue