Presentation 1997/1/22
Composition Influence of PrBaCuO Barrier on Properties of YBaCuO Trilayer Josephson Junctions
Takashi Otazawa, Hiroshi Sato, Kohji Hohkawa, Hiroshi Akoh,
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Abstract(in English) We have investigated the influence of composition of PrBaCuO barriers on the properties of YBaCuO trilayer Josephson junctions. PrBaCuO films (PrBaCuO(I)) with the composition ratio of Pr:Ba:Cu=1:1.3:2.6 had the lower resistivity than the films (PrBaCuO(II)) with the composition ratio of 1:1.8:3.2. YBaCuO trilayer junctions (3×3μm^2) with PrBaCuO(II) barrier of 35nm showed RSJ-like I-V characteristics and high critical current density of 17kA/cm^2 at 10K. This indicates that the junction properties can be controlled by changing the composition ratio of PrBaCuO barrier.
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Keyword(in English) YBaCuO trilayer Josephson junction / PrBaCuO barrier / composition influence / high critical current density
Paper # SCE96-28
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Committee SCE
Conference Date 1997/1/22(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Composition Influence of PrBaCuO Barrier on Properties of YBaCuO Trilayer Josephson Junctions
Sub Title (in English)
Keyword(1) YBaCuO trilayer Josephson junction
Keyword(2) PrBaCuO barrier
Keyword(3) composition influence
Keyword(4) high critical current density
1st Author's Name Takashi Otazawa
1st Author's Affiliation Kanagawa Institute of Technology()
2nd Author's Name Hiroshi Sato
2nd Author's Affiliation Electrotechnical Laboratory
3rd Author's Name Kohji Hohkawa
3rd Author's Affiliation Kanagawa Institute of Technology
4th Author's Name Hiroshi Akoh
4th Author's Affiliation Electrotechnical Laboratory
Date 1997/1/22
Paper # SCE96-28
Volume (vol) vol.96
Number (no) 452
Page pp.pp.-
#Pages 6
Date of Issue