| Presentation | 1997/11/20 Characteristics of the Junctions Having Double AlOx Bariers Hideyuki Sugiyama, Keiichi Kobata, Akira Fujimaki, Hisao Hayakawa, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We fabricated Nb/Al/AlOx/Al/AlOx/Nb junctions having double barriers and investigated those characteristics. The superconductivity in Nb penetrates the Al placed between two AlOx barriers through the barriers due to the proximity effect. Josephson current, accordingly, flows across the junctions. The thicker barrier of the two AlOx barriers is the only one that generates voltage. We deduce that the other barrier performs the part to suppress the proximity effect. The current-voltage curves of the junctions look like the characteristics that an SIS junction and an SIN junction are combined. There exists subgap current in the SIN characteristics and it act as a shunt resistance. Thus, Overdamped characteristics are realized without an external shunt resistance. Furthermore, the spread of the critical current for the 64 junctions connected in series is 1.2%. These show that the junctions gave uniform enough characteristics for use in SFQ integrated circuits. In this monograph, we show that critical current density J_c and I_cR product of the junctions having double AlOx barriers depend on the thicknesses of AlOx barriers. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | double barriers / Nb/Al/AlOx/Al/AlOx/Nb junctions / the proximity effect / overdamped / SFQ circuits |
| Paper # | SCE97-33 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 1997/11/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Characteristics of the Junctions Having Double AlOx Bariers |
| Sub Title (in English) | |
| Keyword(1) | double barriers |
| Keyword(2) | Nb/Al/AlOx/Al/AlOx/Nb junctions |
| Keyword(3) | the proximity effect |
| Keyword(4) | overdamped |
| Keyword(5) | SFQ circuits |
| 1st Author's Name | Hideyuki Sugiyama |
| 1st Author's Affiliation | Department of Quantum Engineering, Nogoya University() |
| 2nd Author's Name | Keiichi Kobata |
| 2nd Author's Affiliation | Department of Electronics, Nogoya University |
| 3rd Author's Name | Akira Fujimaki |
| 3rd Author's Affiliation | Department of Quantum Engineering, Nogoya University |
| 4th Author's Name | Hisao Hayakawa |
| 4th Author's Affiliation | Department of Quantum Engineering, Nogoya University |
| Date | 1997/11/20 |
| Paper # | SCE97-33 |
| Volume (vol) | vol.97 |
| Number (no) | 383 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |