Presentation 1997/11/20
High-speed Testing of Josephson Logic Circuits with an On-chip Signal-pattern Generator
Y. Hashimoto, S. Yorozu, H. Numata, M. Koike, M. Tanaka, S. Tahara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have developed an on-chip signal-pattern generator (SPG) for high-speed testing of Josephson logic circuits. The basis of the SPG is using a feedback shift register, in which the complement output of the last-stage D flip-flop is fed back to the first-stage D flip-flop. Since the SPG consists of only D flip-flops and requires no external control signal, the design and high-speed operation are greatly simplified. We performed a high-speed measurement of the 1-bit SPG and found that the SPG has the potential to operate at a clock frequency of more than 4.6 GHz. We also demonstrated a high-speed testing of a 2-bit logic circuit with the 2-bit SPG up to a clock frequency of 1 GHz.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Josephson Device / Josephson IC / High-speed Testing
Paper # SCE97-26
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Conference Information
Committee SCE
Conference Date 1997/11/20(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High-speed Testing of Josephson Logic Circuits with an On-chip Signal-pattern Generator
Sub Title (in English)
Keyword(1) Josephson Device
Keyword(2) Josephson IC
Keyword(3) High-speed Testing
1st Author's Name Y. Hashimoto
1st Author's Affiliation Fundamental Research Labs., NEC Corporation()
2nd Author's Name S. Yorozu
2nd Author's Affiliation Fundamental Research Labs., NEC Corporation
3rd Author's Name H. Numata
3rd Author's Affiliation Fundamental Research Labs., NEC Corporation
4th Author's Name M. Koike
4th Author's Affiliation Fundamental Research Labs., NEC Corporation
5th Author's Name M. Tanaka
5th Author's Affiliation Fundamental Research Labs., NEC Corporation
6th Author's Name S. Tahara
6th Author's Affiliation Fundamental Research Labs., NEC Corporation
Date 1997/11/20
Paper # SCE97-26
Volume (vol) vol.97
Number (no) 383
Page pp.pp.-
#Pages 6
Date of Issue