Presentation	2002/1/10 Reduction of the Spike Noise by using Antiferromagnetic layers in Double-layered Perpendicular Recording Media S. Watanabe, S. Takenoiri, Y. Sakai, K. Enomoto, K. Ohkubo,
PDF Download Page	PDF download Page Link
Abstract(in Japanese)	(See Japanese page)
Abstract(in English)	In this study, we address problems of the spike noise from soft magnetic layer by utilizing antiferromagnetic coupling. It was found that magnetic domain structures of soft magnetic layers depend on different materials on the basis of domain observation and that exchange bias field H_ was estimated 40Oe by measuring magnetic fields inside HDDs. Through the experiments using IrMn and PtMn as antiferromagnetic layers, it was concluded the spike nosie from media with greater H_ is reduced more effectively. We obtain satisfactory reduction of the spike nosie and control domain walls of soft magnetic layer by cooling under an application of magnetic field.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	perpendicular recording media / soft magnetic layer / antiferromagnetic layer / spike noise / cooling under magnetic field
Paper #	2001-MR-90
Date of Issue

Conference Information
Committee	MR
Conference Date	2002/1/10(1days)
Place (in Japanese)	(See Japanese page)
Place (in English)
Topics (in Japanese)	(See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To	Magnetic Recording (MR)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Reduction of the Spike Noise by using Antiferromagnetic layers in Double-layered Perpendicular Recording Media
Sub Title (in English)
Keyword(1)	perpendicular recording media
Keyword(2)	soft magnetic layer
Keyword(3)	antiferromagnetic layer
Keyword(4)	spike noise
Keyword(5)	cooling under magnetic field
1st Author's Name	S. Watanabe
1st Author's Affiliation	Fuji Electric Corporate R&D, Ltd., Device Technology Laboratory()
2nd Author's Name	S. Takenoiri
2nd Author's Affiliation	Fuji Electric Corporate R&D, Ltd., Device Technology Laboratory
3rd Author's Name	Y. Sakai
3rd Author's Affiliation	Fuji Electric Co., Ltd., Electronics Company
4th Author's Name	K. Enomoto
4th Author's Affiliation	Fuji Electric Co., Ltd., Electronics Company
5th Author's Name	K. Ohkubo
5th Author's Affiliation	Fuji Electric Co., Ltd., Electronics Company
Date	2002/1/10
Paper #	2001-MR-90
Volume (vol)	vol.101
Number (no)	564
Page	pp.pp.-
#Pages	7
Date of Issue