講演名 | 1999/2/26 Characterization of magnetoresistance in ferromagnetic/oxide/ferromagnetic structured thin films , |
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抄録(和) | |
抄録(英) | Since large magnetoresistance (MR) effects were reported in FM/I/FM structured magnetic tunnel junction (MTJ) thin films, a lot of works have been performed on the MR characteristics of those films for advanced magnetic devices. Although MTJ thin films showed excellent MR properties such as tens of MR ratio, more reliable and stable formation of insulating layer has been remained as a obstruction for recently developed magnetic devices. Therefore, in this work, MR properties were characterized using FM/I/FM structured thin films as a function of formation conditions of Al Oxide insulating layer, which was reported as a good insulating layer in MTJ thin films. |
キーワード(和) | |
キーワード(英) | Magnetoresistance / Magnetic Tunnel Junction(MTJ) / Insulating layer / Al Oxide |
資料番号 | MR-98-90 |
発行日 |
研究会情報 | |
研究会 | MR |
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開催期間 | 1999/2/26(から1日開催) |
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講演論文情報詳細 | |
申込み研究会 | Magnetic Recording (MR) |
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本文の言語 | ENG |
タイトル(和) | |
サブタイトル(和) | |
タイトル(英) | Characterization of magnetoresistance in ferromagnetic/oxide/ferromagnetic structured thin films |
サブタイトル(和) | |
キーワード(1)(和/英) | / Magnetoresistance |
第 1 著者 氏名(和/英) | / Yong-Jin Cho |
第 1 著者 所属(和/英) | Division of Materials Science and Engineering, Seoul National University |
発表年月日 | 1999/2/26 |
資料番号 | MR-98-90 |
巻番号(vol) | vol.98 |
号番号(no) | 621 |
ページ範囲 | pp.- |
ページ数 | 5 |
発行日 |