Presentation 1998/9/18
Exchange bias field in Ni-Fe/FeMn bilayers for spin valve
Koichi NISHIMURA, Yutaka SHIMIZU, Shigeki NAKAGAWA, MASAHIKO Naoe,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Ni-Fe/FeMn bilayers for spin valve were deposited using dual ion beam sputtering(DIBS)apparatus.For the application of tunneling magnetoresistive(TMR)spin valve, Ni-Fe/FeMn bilayers were deposited on Si_3N_4 dielectric layer and Si semiconductor layer.Although Ni-Fe/FeMn bilayers deposited on Si_3N_4 buffer layer did not exhibit the detectable exchange bias field H_ex. Ion bombardment at Ni-Fe/FeMn interface with moderate acceleration, (111)orientation in FeMn crystallites were improved and Ni-Fe/FeMn bilayers exhibited H_ex. of about 35 Oe.Ni-Fe/FeMn bilayers depositedd on Si buffer layer exhibited high H_ex.of about 134 Oe.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) dual ion beam sputtering / spin valve / tunneling magnetoresisteve / exchange bias field
Paper # MR98-16
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Committee MR
Conference Date 1998/9/18(1days)
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Registration To Magnetic Recording (MR)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Exchange bias field in Ni-Fe/FeMn bilayers for spin valve
Sub Title (in English)
Keyword(1) dual ion beam sputtering
Keyword(2) spin valve
Keyword(3) tunneling magnetoresisteve
Keyword(4) exchange bias field
1st Author's Name Koichi NISHIMURA
1st Author's Affiliation Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology()
2nd Author's Name Yutaka SHIMIZU
2nd Author's Affiliation Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology
3rd Author's Name Shigeki NAKAGAWA
3rd Author's Affiliation Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology
4th Author's Name MASAHIKO Naoe
4th Author's Affiliation Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology
Date 1998/9/18
Paper # MR98-16
Volume (vol) vol.98
Number (no) 281
Page pp.pp.-
#Pages 7
Date of Issue