Presentation | 1998/9/18 Exchange bias field in Ni-Fe/FeMn bilayers for spin valve Koichi NISHIMURA, Yutaka SHIMIZU, Shigeki NAKAGAWA, MASAHIKO Naoe, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Ni-Fe/FeMn bilayers for spin valve were deposited using dual ion beam sputtering(DIBS)apparatus.For the application of tunneling magnetoresistive(TMR)spin valve, Ni-Fe/FeMn bilayers were deposited on Si_3N_4 dielectric layer and Si semiconductor layer.Although Ni-Fe/FeMn bilayers deposited on Si_3N_4 buffer layer did not exhibit the detectable exchange bias field H_ex. Ion bombardment at Ni-Fe/FeMn interface with moderate acceleration, (111)orientation in FeMn crystallites were improved and Ni-Fe/FeMn bilayers exhibited H_ex. of about 35 Oe.Ni-Fe/FeMn bilayers depositedd on Si buffer layer exhibited high H_ex.of about 134 Oe. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | dual ion beam sputtering / spin valve / tunneling magnetoresisteve / exchange bias field |
Paper # | MR98-16 |
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Conference Information | |
Committee | MR |
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Conference Date | 1998/9/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Magnetic Recording (MR) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Exchange bias field in Ni-Fe/FeMn bilayers for spin valve |
Sub Title (in English) | |
Keyword(1) | dual ion beam sputtering |
Keyword(2) | spin valve |
Keyword(3) | tunneling magnetoresisteve |
Keyword(4) | exchange bias field |
1st Author's Name | Koichi NISHIMURA |
1st Author's Affiliation | Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology() |
2nd Author's Name | Yutaka SHIMIZU |
2nd Author's Affiliation | Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology |
3rd Author's Name | Shigeki NAKAGAWA |
3rd Author's Affiliation | Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology |
4th Author's Name | MASAHIKO Naoe |
4th Author's Affiliation | Department of Physical Electronics, Faculty of Engineering, Tokyo Institute of Technology |
Date | 1998/9/18 |
Paper # | MR98-16 |
Volume (vol) | vol.98 |
Number (no) | 281 |
Page | pp.pp.- |
#Pages | 7 |
Date of Issue |