Presentation 1996/10/3
MICROSTRUCTURE AND CORROSION RESISTANCE OF Fe-Hf-N SOFT MAGNETIC THIN FILMS
F. Kirino, S. Ootomo, N. Koiso,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Microstructure and corrosion resistance of Fe-Hf-N soft magnetic thin films developed for digital VTR and data streamer applications are studied. Fe-Hf-N films of which Bs values are more than 1.5 T, consist of microcrystalline grians. The crystalline grain sizes of Fe and Hf-N particles in a Fe-Hf-N film are determined to be 8 and 2 nm, respectively. These of Fe and TaC particles in Fe-Ta-C-Al alloy film are 10~12 nm and 4~5 nm, respectively. Control of Fe and Hf-N crystalline grain sizes are important to realize useful soft magnetic characteristics as well as high corrosion resistance. Unlike the case of the Fe-Ta-C soft magnetic thin film, where an addition element such as Al is added to enhance corrosion resistance, the Fe-Hf-N soft magetic thin film, where micrograin atoms are possibly dissolved in Fe crystalline grains, shows high corrosion resistance which is suitable for magnetic head applications. At the same time, N may be possibly dissolving into Fe crystal phase. As a result, A Fe-Hf-N soft magnetic thin film has a high corrosion resistance, without a additional element such as Al of Fe-Ta-C soft magnetic thin film.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Bs / corrosion resistance / magnetic head / soft magnetic material / solid solution / Fe-Hf-N
Paper # MR96-28
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Committee MR
Conference Date 1996/10/3(1days)
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Registration To Magnetic Recording (MR)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) MICROSTRUCTURE AND CORROSION RESISTANCE OF Fe-Hf-N SOFT MAGNETIC THIN FILMS
Sub Title (in English)
Keyword(1) Bs
Keyword(2) corrosion resistance
Keyword(3) magnetic head
Keyword(4) soft magnetic material
Keyword(5) solid solution
Keyword(6) Fe-Hf-N
1st Author's Name F. Kirino
1st Author's Affiliation Central Res. Lab., Hitachi. Ltd.()
2nd Author's Name S. Ootomo
2nd Author's Affiliation Central Res. Lab., Hitachi. Ltd.:Electronic Devices Works, Hitachi. Ltd.
3rd Author's Name N. Koiso
3rd Author's Affiliation Central Res. Lab., Hitachi. Ltd.
Date 1996/10/3
Paper # MR96-28
Volume (vol) vol.96
Number (no) 286
Page pp.pp.-
#Pages 8
Date of Issue