Presentation 1999/6/24
Measurement of the resonance frequency of contactless IC cards using an EOS probe
Koji Tsuru, Koushi Murata, Yoshimitsu Ohtani, Yasuhiro Nagai, Mitsuru Shinagawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A novel measurement of the resonance frequency for contactess IC cards is presented. The resonance frequency of the contactless IC card was difficult to precisely determined because of electro-magnetic coupling between the antenna in the card and measurement probes, although the frequency is very important factor on energy and data transmission. Thus, an electro-optic-sampling (EOS) probe was employed to detect the resonance frequency of the cards. By using the EOS probe, precise resonance frequency measurement is achieved without influence of electric coupling.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) IC card / contactless / resonance / frequency / electro-optic effect / EOS probes
Paper # RCS99-25
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Conference Information
Committee RCS
Conference Date 1999/6/24(1days)
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Registration To Radio Communication Systems (RCS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of the resonance frequency of contactless IC cards using an EOS probe
Sub Title (in English)
Keyword(1) IC card
Keyword(2) contactless
Keyword(3) resonance
Keyword(4) frequency
Keyword(5) electro-optic effect
Keyword(6) EOS probes
1st Author's Name Koji Tsuru
1st Author's Affiliation NTT Cyber Space Labs()
2nd Author's Name Koushi Murata
2nd Author's Affiliation NTT Cyber Space Labs
3rd Author's Name Yoshimitsu Ohtani
3rd Author's Affiliation NTT Cyber Space Labs
4th Author's Name Yasuhiro Nagai
4th Author's Affiliation NTT Cyber Space Labs
5th Author's Name Mitsuru Shinagawa
5th Author's Affiliation NTT Communication Energy Labs
Date 1999/6/24
Paper # RCS99-25
Volume (vol) vol.99
Number (no) 141
Page pp.pp.-
#Pages 5
Date of Issue