Presentation | 1998/10/22 Experimental investigation of carrier recovery circuit using fourth power multiplication device for root Nyquist bandlimited QPSK Kazunori TAKAHASHI, Seizo SEKI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The characteristics of carrier recovery circuit using 4th power multiplication device for a conventional QPSK signaling is evaluated experimentally. The carrier recovery circuit is built for the experimental QPSK system where the carrier frequency is 10.7MHz and the symbol rate is 64 kS/s.The performance of the carrier recovery circuit is investigated through measurement of the bit error rate(BER)as functions of SNR, CNR and E_b/N_0. Bandlimitation scheme is root roll-off, where roll-off factor α is from 0.3 to 0.8 with the interval of 0.1. The result showed that experimental values of BER well corresponded to calculation when rms phase jitter distribution was assumed as normal distribution. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | carrier recovery circuit using fourth power multiplication device / root rool-off filter / bit error rate / rms phase jitter |
Paper # | A・P98-56,RCS98-101 |
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Conference Information | |
Committee | RCS |
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Conference Date | 1998/10/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Radio Communication Systems (RCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Experimental investigation of carrier recovery circuit using fourth power multiplication device for root Nyquist bandlimited QPSK |
Sub Title (in English) | |
Keyword(1) | carrier recovery circuit using fourth power multiplication device |
Keyword(2) | root rool-off filter |
Keyword(3) | bit error rate |
Keyword(4) | rms phase jitter |
1st Author's Name | Kazunori TAKAHASHI |
1st Author's Affiliation | Department of Electrical Engineering, Science University of Tokyo() |
2nd Author's Name | Seizo SEKI |
2nd Author's Affiliation | Department of Electrical Engineering, Science University of Tokyo |
Date | 1998/10/22 |
Paper # | A・P98-56,RCS98-101 |
Volume (vol) | vol.98 |
Number (no) | 358 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |