Presentation 1995/11/27
Analysis of bit-error structure under multipath environments in digital mobile radio communication
Hidefumi MURATA, Toshiyuki MAEYAMA, Fumio IKEGAMI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) It was reconfirmed that bit-errors are caused by thermal noise when anti-multipath modulation technique (BPSK-RZ) could suppress the effects of multipath distortion. Measurements showed that the static bit-error characteristics for BPSK are deteriorated under multipath environments; but that BPSK-RZ could suppress the deterioration.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Digital mobile radio communication / Bit-error structure / Anti-multipath modulation technique / Static bit-error rate curve
Paper # RCS95-107
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Conference Information
Committee RCS
Conference Date 1995/11/27(1days)
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Registration To Radio Communication Systems (RCS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of bit-error structure under multipath environments in digital mobile radio communication
Sub Title (in English)
Keyword(1) Digital mobile radio communication
Keyword(2) Bit-error structure
Keyword(3) Anti-multipath modulation technique
Keyword(4) Static bit-error rate curve
1st Author's Name Hidefumi MURATA
1st Author's Affiliation Faculty of Engineering, Takushoku University()
2nd Author's Name Toshiyuki MAEYAMA
2nd Author's Affiliation Faculty of Engineering, Takushoku University
3rd Author's Name Fumio IKEGAMI
3rd Author's Affiliation Faculty of Engineering, Takushoku University
Date 1995/11/27
Paper # RCS95-107
Volume (vol) vol.95
Number (no) 390
Page pp.pp.-
#Pages 6
Date of Issue