Presentation | 1995/11/27 Analysis of bit-error structure under multipath environments in digital mobile radio communication Hidefumi MURATA, Toshiyuki MAEYAMA, Fumio IKEGAMI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It was reconfirmed that bit-errors are caused by thermal noise when anti-multipath modulation technique (BPSK-RZ) could suppress the effects of multipath distortion. Measurements showed that the static bit-error characteristics for BPSK are deteriorated under multipath environments; but that BPSK-RZ could suppress the deterioration. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Digital mobile radio communication / Bit-error structure / Anti-multipath modulation technique / Static bit-error rate curve |
Paper # | RCS95-107 |
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Conference Information | |
Committee | RCS |
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Conference Date | 1995/11/27(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Radio Communication Systems (RCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of bit-error structure under multipath environments in digital mobile radio communication |
Sub Title (in English) | |
Keyword(1) | Digital mobile radio communication |
Keyword(2) | Bit-error structure |
Keyword(3) | Anti-multipath modulation technique |
Keyword(4) | Static bit-error rate curve |
1st Author's Name | Hidefumi MURATA |
1st Author's Affiliation | Faculty of Engineering, Takushoku University() |
2nd Author's Name | Toshiyuki MAEYAMA |
2nd Author's Affiliation | Faculty of Engineering, Takushoku University |
3rd Author's Name | Fumio IKEGAMI |
3rd Author's Affiliation | Faculty of Engineering, Takushoku University |
Date | 1995/11/27 |
Paper # | RCS95-107 |
Volume (vol) | vol.95 |
Number (no) | 390 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |