Presentation 2000/9/21
Artifact-metric Systems
Hiroyuki MATSUMOTO, Tsutomu MATSUMOTO,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) The concept of authenticating each artifact by checking intrinsic patterns randomly created on it originated in tampering detection of specific items for intelligence and arms control applications. It has been researched, for a long time, with the aim of applying to tampering detection or clone pervention. We propose that such individual authentication systems should be categorized as artifact-metric systems. In this paper we give a systematic definition of the artifact-metric systems, and also give an overview of the systems which have been proposed. Finally, we compare the artifact-metric systems with biometric systems, and discuss their advantages and disadvantages.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) clone prevention / tampering detection / anti-counterfeit / document protection / security seals
Paper # ISEC2000-59
Date of Issue

Conference Information
Committee ISEC
Conference Date 2000/9/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Information Security (ISEC)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Artifact-metric Systems
Sub Title (in English)
Keyword(1) clone prevention
Keyword(2) tampering detection
Keyword(3) anti-counterfeit
Keyword(4) document protection
Keyword(5) security seals
1st Author's Name Hiroyuki MATSUMOTO
1st Author's Affiliation Division of Artificial Environment and Systems, Yokohama National University:Research and Development Division, NHK SPRING CO., LTD.()
2nd Author's Name Tsutomu MATSUMOTO
2nd Author's Affiliation Division of Artificial Environment and Systems, Yokohama National University
Date 2000/9/21
Paper # ISEC2000-59
Volume (vol) vol.100
Number (no) 323
Page pp.pp.-
#Pages 8
Date of Issue