| Presentation | 2001/11/1 Luminescent characteristic of test PDP panel using blue-emitting CaMgSi_2O_6:Eu^<2+> phosphor Ryo Yoshimatsu, Takashi Kunimoto, Shingo Honda, Koutoku Ohmi, Shosaku Tanaka, Hiroshi Kobayashi, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Current blue PDP phosphor BaMgAl_<10>O_<17>:Eu^<2+>(BAM)shows serious luminance degradation. Therefore, we examined CaMgSi_2O_6:Eu^<2+>(CMS:Eu^<2+>)showing a blue emission as a new phosphor for PDP applications. The comparison of deterioration in fabrication process and driving process for CMS:EU^<2+> and BAM test panel was performed. Whereas BAM shows about 50% of initial intensity in baking process, CMS:Eu^<2+> keeps initial intensity after baking at 600℃. After 300 hours driving BAM test panel shows a decrease of luminescent intensity to about 60% of initial intensity, while CMS:Eu^<2+> test panel keeps about 90% of initial intensity. We also examined to synthesize(Ca, Sr)MgSi_2O_6:Eu^<2+> to improve the luminance of CMS:Eu^<2+>. Peak wavelength shifts toward 444 nm for the sample with 50% Sr versus Ca, resulting in the decrease of luminance. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BaMgAl_<10>O_<17>:Eu^<2+> / CaMgSi_2O_6:Eu^<2+> / process degradation / driving degradation |
| Paper # | EID2001-46 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 2001/11/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Luminescent characteristic of test PDP panel using blue-emitting CaMgSi_2O_6:Eu^<2+> phosphor |
| Sub Title (in English) | |
| Keyword(1) | BaMgAl_<10>O_<17>:Eu^<2+> |
| Keyword(2) | CaMgSi_2O_6:Eu^<2+> |
| Keyword(3) | process degradation |
| Keyword(4) | driving degradation |
| 1st Author's Name | Ryo Yoshimatsu |
| 1st Author's Affiliation | Dept.of Electrical and Electronic Eng.Tottori Univ.() |
| 2nd Author's Name | Takashi Kunimoto |
| 2nd Author's Affiliation | Venture Business Laboratory, Kobe University |
| 3rd Author's Name | Shingo Honda |
| 3rd Author's Affiliation | Dept.of Electrical and Electronic Eng.Tottori Univ. |
| 4th Author's Name | Koutoku Ohmi |
| 4th Author's Affiliation | Dept.of Electrical and Electronic Eng.Tottori Univ. |
| 5th Author's Name | Shosaku Tanaka |
| 5th Author's Affiliation | Dept.of Electrical and Electronic Eng.Tottori Univ. |
| 6th Author's Name | Hiroshi Kobayashi |
| 6th Author's Affiliation | Dept.of Electrical and Electronic Eng.Tottori Univ. |
| Date | 2001/11/1 |
| Paper # | EID2001-46 |
| Volume (vol) | vol.101 |
| Number (no) | 404 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |