| Presentation | 2001/11/1 A Study on a Readout Circuit with High Signal to Noise Ratio for a CMOS Image Sensor Overlaid with a HARP Layer Toshihisa Watabe, Hiroshi Ohtake, Masahide Goto, Hideki Kokubun, Toshihide Watanabe, Norifumi Egami, Kenkichi Tanioka, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We developed a CMOS readout circuit with a high S/N for a solid-state HARP imaging devices. A CMOS readout circuit is composed of a charge transfer type voltage multiplier and CDS circuit. Signal charges produced in a pixel are transferred to a smaller capacitance by this charge transfer circuit and signal voltage can be amplified. This circuit is arranged in each column. A prototype chip was fabricated and the characteristics were evaluated. A measured data shows that the circuit can reduce vertical FPN by 4.6dB and random noise by 8.1dB compared with the line amp type readout circuit. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Solid-state HARP imager / HARP layer / CMOS / Charge transfer / S/N / Fixed Pattern Noise(FPN) |
| Paper # | EID2001-44 |
| Date of Issue |
| Conference Information | |
| Committee | EID |
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| Conference Date | 2001/11/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on a Readout Circuit with High Signal to Noise Ratio for a CMOS Image Sensor Overlaid with a HARP Layer |
| Sub Title (in English) | |
| Keyword(1) | Solid-state HARP imager |
| Keyword(2) | HARP layer |
| Keyword(3) | CMOS |
| Keyword(4) | Charge transfer |
| Keyword(5) | S/N |
| Keyword(6) | Fixed Pattern Noise(FPN) |
| 1st Author's Name | Toshihisa Watabe |
| 1st Author's Affiliation | Science and Technical Research Laboratories, NHK() |
| 2nd Author's Name | Hiroshi Ohtake |
| 2nd Author's Affiliation | Science and Technical Research Laboratories, NHK |
| 3rd Author's Name | Masahide Goto |
| 3rd Author's Affiliation | Science and Technical Research Laboratories, NHK |
| 4th Author's Name | Hideki Kokubun |
| 4th Author's Affiliation | NHK Engineering Service Inc. |
| 5th Author's Name | Toshihide Watanabe |
| 5th Author's Affiliation | Engineering Administration Department, NHK |
| 6th Author's Name | Norifumi Egami |
| 6th Author's Affiliation | Science and Technical Research Laboratories, NHK |
| 7th Author's Name | Kenkichi Tanioka |
| 7th Author's Affiliation | Science and Technical Research Laboratories, NHK |
| Date | 2001/11/1 |
| Paper # | EID2001-44 |
| Volume (vol) | vol.101 |
| Number (no) | 404 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |