Presentation 2000/10/13
Investigation on the Simulating Field and Track of Electrons in FFEA
Xiaosheng Qu, Dejie Li, Baolun Yao,
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Abstract(in English) A distribution graph of electronic potential and track near cathode microtip in FFEA was obtained by finite difference simulating three dimensions for texture of double gate FFEA. It is clearly a result that electrons focusing effect becomes stronger as the focus electrode bias decreases toward the tip potential. If negative focusing electrode bias, we may affirm that the electronic lens repels almost all electrons and finally return to the grid electrode. The potential of gate electrode almost dose not affect the trajectories of electrons from microtip by the quantum tunneling metal cathode, which can only increase electronic amount as voltage applied gate become more higher. The electrons that are of bigger shooting angle will be embarrassed as diameter of focus electrode reduce.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Finite difference / Focus FEA / Trajectories of electrons / Emitter microtip / Electron beams / Simulating calculation
Paper # EID2000-124
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Conference Date 2000/10/13(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Investigation on the Simulating Field and Track of Electrons in FFEA
Sub Title (in English)
Keyword(1) Finite difference
Keyword(2) Focus FEA
Keyword(3) Trajectories of electrons
Keyword(4) Emitter microtip
Keyword(5) Electron beams
Keyword(6) Simulating calculation
1st Author's Name Xiaosheng Qu
1st Author's Affiliation Department of electronic engineering, Thsinghua University()
2nd Author's Name Dejie Li
2nd Author's Affiliation Department of electronic engineering, Thsinghua University
3rd Author's Name Baolun Yao
3rd Author's Affiliation Department of electronic engineering, Thsinghua University
Date 2000/10/13
Paper # EID2000-124
Volume (vol) vol.100
Number (no) 356
Page pp.pp.-
#Pages 5
Date of Issue