| Presentation | 2000/10/13 Simulation Analysis of Negative Resistance Effect in OLED XIONG Shao-zhen, ZHAO Ying, HAO Yun, WANG Yao, ZHOU Zhen-hua, WU Chun-ya, YU Gang, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A negative resistance phenomenon(NRP)in some polymer light emitting diodes(PLED)was observed and analyzed. This NRP appears in devices after long term storage without bias and disappear after consecutively scan the I-V curves over certain bias level. An internal reverse junction was proposed to interpret this NRP. In addition to the NRP, Hysteresis of I-V data over consecutive runs was also observed, similar to the effect frequently observed in non-crystalline inorganic semiconductors. Such field-drifting characteristics can be explained by carrier trapping mechanism. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Negative resistance phenomenon(NRP) / Field-drift / contact property / F-N model / Trapped carriers / limited / Polymer light emitting diode(PLED) |
| Paper # | EID2000-109 |
| Date of Issue |
| Conference Information | |
| Committee | EID |
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| Conference Date | 2000/10/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Simulation Analysis of Negative Resistance Effect in OLED |
| Sub Title (in English) | |
| Keyword(1) | Negative resistance phenomenon(NRP) |
| Keyword(2) | Field-drift |
| Keyword(3) | contact property |
| Keyword(4) | F-N model |
| Keyword(5) | Trapped carriers |
| Keyword(6) | limited |
| Keyword(7) | Polymer light emitting diode(PLED) |
| 1st Author's Name | XIONG Shao-zhen |
| 1st Author's Affiliation | Institute of Photo-electronics, Nankai University, Key Laboratory of Opto-electronics Information Technical Science, EMC. China Laboratory of Semiconductor Materials Science() |
| 2nd Author's Name | ZHAO Ying |
| 2nd Author's Affiliation | Institute of Photo-electronics, Nankai University, Key Laboratory of Opto-electronics Information Technical Science, EMC. China Laboratory of Semiconductor Materials Science |
| 3rd Author's Name | HAO Yun |
| 3rd Author's Affiliation | Institute of Photo-electronics, Nankai University, Key Laboratory of Opto-electronics Information Technical Science, EMC. China Laboratory of Semiconductor Materials Science |
| 4th Author's Name | WANG Yao |
| 4th Author's Affiliation | Institute of Photo-electronics, Nankai University, Key Laboratory of Opto-electronics Information Technical Science, EMC. China Laboratory of Semiconductor Materials Science |
| 5th Author's Name | ZHOU Zhen-hua |
| 5th Author's Affiliation | Institute of Photo-electronics, Nankai University, Key Laboratory of Opto-electronics Information Technical Science, EMC. China Laboratory of Semiconductor Materials Science |
| 6th Author's Name | WU Chun-ya |
| 6th Author's Affiliation | Institute of Photo-electronics, Nankai University, Key Laboratory of Opto-electronics Information Technical Science, EMC. China Laboratory of Semiconductor Materials Science |
| 7th Author's Name | YU Gang |
| 7th Author's Affiliation | UNIAX Corporation |
| Date | 2000/10/13 |
| Paper # | EID2000-109 |
| Volume (vol) | vol.100 |
| Number (no) | 356 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |