Presentation 2000/1/27
Generation Yield and Usable Percentage of Resonance in an AC-PDP
Toshihiro Yoshioka, Akifumi Okigawa, Kaoru Toki,
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Abstract(in English) Xe 147 nm resonance and Xe_2 excimer emissions are mainly employed to excite phosphors in PDP cells. Because the discharge gas filled in the cell strongly absorbs the resonance, radiation trapping has influences on PDP characteristics. In this report, we try to estimate a percentage of resonance photons that arrive at the phosphors and an effective imprisonment time of Xe(1s_4)initial state of resonance by use of modified 3-dimensional model based on 1-dimensional imprisonment simulation. As results for conventional cell structure and gas mixture, only about 40% resonance reaches the phosphors. The imprisonment time combining with an absolute density profile of Xe(1s_4)by Laser Absorption Spectroscopy could expect the resonance yield of 1.5 x 10^8[photon / pulse]in a cell.
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Keyword(in English) Plasma Display Panel / Resonance Emission / Radiation Trapping
Paper # EID99-87
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Conference Date 2000/1/27(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Generation Yield and Usable Percentage of Resonance in an AC-PDP
Sub Title (in English)
Keyword(1) Plasma Display Panel
Keyword(2) Resonance Emission
Keyword(3) Radiation Trapping
1st Author's Name Toshihiro Yoshioka
1st Author's Affiliation NEC Corp., Functional Devices Research Labs., Display Devices Research Lab.()
2nd Author's Name Akifumi Okigawa
2nd Author's Affiliation NEC Corp., Functional Devices Research Labs., Display Devices Research Lab.
3rd Author's Name Kaoru Toki
3rd Author's Affiliation NEC Corp., Functional Devices Research Labs., Display Devices Research Lab.
Date 2000/1/27
Paper # EID99-87
Volume (vol) vol.99
Number (no) 597
Page pp.pp.-
#Pages 6
Date of Issue