Presentation | 2000/1/27 Stability of High Frequency Drived Oxide Phosphor TFEL Devices using a Thick Ceramic Insulator Toshikuni NAKATANI, Shingo SUZUKI, Toshihiro MIYATA, Tadatsugu MINAMI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The stability of various oxide phosphors used as the emitting layer in high-frequency driven TFEL devices is reported. Thick ceramic-insulating-layer-type TFEL devices with a Zn_2Si_xGe_<1-x>O_4 : Mn or Ga_2O_3 : Mn thin-film emitting layer were life-tested under 10 kHz sinusoidal wave voltage driving. An unsealed Ga_2O_3 : Mn TFEL device exhibited long term stable operation of more than 10000 hours at room temperature in the atmosphere. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | electroluminescence / TFELdevice / phosphor / oxide phosphor / Ga_2O_3 / ceramic |
Paper # | EID99-81 |
Date of Issue |
Conference Information | |
Committee | EID |
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Conference Date | 2000/1/27(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Stability of High Frequency Drived Oxide Phosphor TFEL Devices using a Thick Ceramic Insulator |
Sub Title (in English) | |
Keyword(1) | electroluminescence |
Keyword(2) | TFELdevice |
Keyword(3) | phosphor |
Keyword(4) | oxide phosphor |
Keyword(5) | Ga_2O_3 |
Keyword(6) | ceramic |
1st Author's Name | Toshikuni NAKATANI |
1st Author's Affiliation | Electron Device System Laboratory, Kanazawa Institute of Technology() |
2nd Author's Name | Shingo SUZUKI |
2nd Author's Affiliation | Electron Device System Laboratory, Kanazawa Institute of Technology |
3rd Author's Name | Toshihiro MIYATA |
3rd Author's Affiliation | Electron Device System Laboratory, Kanazawa Institute of Technology |
4th Author's Name | Tadatsugu MINAMI |
4th Author's Affiliation | Electron Device System Laboratory, Kanazawa Institute of Technology |
Date | 2000/1/27 |
Paper # | EID99-81 |
Volume (vol) | vol.99 |
Number (no) | 597 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |