講演名 | 1999/3/19 Measurement on the modulation depth of Moire and spot size , |
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抄録(和) | |
抄録(英) | It is known that moire is the counterpart of readability/focus performance. Nowadays, the requirement on the readability of a CDT is getting higher and forces the gun designers to make beam spot smaller and smaller. This makes moire inevitable under certain application conditions, because the visibility of moire pattern is determined by the electron beam spot, while the structure of mask aperture determines moire wavelength. This paper is devoted to study the relationship between the visibility of scan moire and spot size from measurements. The modulation depth (MD) of moire and electron beam spot are measured by a CCD camera. By varying the horizontal Dynamic Astigmatism and Focus (DAF) voltage, the variations of moire MD with beam spot are acquired. It is found that the spot size at both 5% and 50% of luminance distribution can characterize the moire MD in agreement with theoretical calculation. |
キーワード(和) | |
キーワード(英) | moire / modulation depth / DAB |
資料番号 | EID98-250 |
発行日 |
研究会情報 | |
研究会 | EID |
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開催期間 | 1999/3/19(から1日開催) |
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講演論文情報詳細 | |
申込み研究会 | Electronic Information Displays (EID) |
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本文の言語 | ENG |
タイトル(和) | |
サブタイトル(和) | |
タイトル(英) | Measurement on the modulation depth of Moire and spot size |
サブタイトル(和) | |
キーワード(1)(和/英) | / moire |
第 1 著者 氏名(和/英) | / Cho-Liang Liang |
第 1 著者 所属(和/英) | CRT R&D Division, TECO Information Systents Co., Ltd. |
発表年月日 | 1999/3/19 |
資料番号 | EID98-250 |
巻番号(vol) | vol.98 |
号番号(no) | 666 |
ページ範囲 | pp.- |
ページ数 | 4 |
発行日 |