Presentation | 1999/3/19 Novel Method for CRT Display ITC Measurement Charles Chuang, Roger Hong, Jerry Tsai, Jeff Chou, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Windowing environment of computing systems is driving the displays larger and the demand for CRT display convergence and purity tighter. Advent of flat panel displays is also driving the CRT display toward smaller depths, hence much larger deflection angles. These two factors made ITC much tougher than before. At 17" and above, number of measurement points on the screen needed for ITC is expanding beyond simple 9 or 25 points. Legacy one camera per data point approach is quickly running out of steam, not to mention the prohibitive cost of such systems. Clearly, a better solution is needed. |
Keyword(in Japanese) | (See Japanese page) |
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Paper # | EID98-246 |
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Committee | EID |
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Conference Date | 1999/3/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Electronic Information Displays (EID) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Novel Method for CRT Display ITC Measurement |
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1st Author's Name | Charles Chuang |
1st Author's Affiliation | Dyan Color Inc.() |
2nd Author's Name | Roger Hong |
2nd Author's Affiliation | Dyan Color Inc. |
3rd Author's Name | Jerry Tsai |
3rd Author's Affiliation | Dyan Color Inc. |
4th Author's Name | Jeff Chou |
4th Author's Affiliation | Dyan Color Inc. |
Date | 1999/3/19 |
Paper # | EID98-246 |
Volume (vol) | vol.98 |
Number (no) | 666 |
Page | pp.pp.- |
#Pages | 4 |
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