| Presentation | 1999/3/19 Evaluation of residual DC of LC Cell Yuji Nakazono, Toshiyuki Takagi, Atsushi Sawada, Shohei Naemura, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Residual DC phenomenon is discussed based on the simulation with equivalent circuit of LC cell and experiments for three kind of cells which has different alignment layer with different specific resistivity values. Interfacial and dipole polarization of multi layered dielectrics is caused by DC voltage application. r-DC observed in short time range (few min.) can be explained by this polarization. Even after the interfacial polarization is relaxed, however, some amount of ions, which moved close to the interface between the LC and the alignment layers, remain for a longer time due to an adsorption phenomenon. The observed r-DC voltage for a longer time range, typically over 1 hour, can be explained by this model of ion adsorption. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | AM-LCD / ion / residual DC voltage / interfacial polarization |
| Paper # | EID98-242 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 1999/3/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of residual DC of LC Cell |
| Sub Title (in English) | |
| Keyword(1) | AM-LCD |
| Keyword(2) | ion |
| Keyword(3) | residual DC voltage |
| Keyword(4) | interfacial polarization |
| 1st Author's Name | Yuji Nakazono |
| 1st Author's Affiliation | Atsugi Technical Center, Merck Japan Limited() |
| 2nd Author's Name | Toshiyuki Takagi |
| 2nd Author's Affiliation | Atsugi Technical Center, Merck Japan Limited |
| 3rd Author's Name | Atsushi Sawada |
| 3rd Author's Affiliation | Atsugi Technical Center, Merck Japan Limited |
| 4th Author's Name | Shohei Naemura |
| 4th Author's Affiliation | Atsugi Technical Center, Merck Japan Limited |
| Date | 1999/3/19 |
| Paper # | EID98-242 |
| Volume (vol) | vol.98 |
| Number (no) | 666 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |