| Presentation | 1999/3/19 Shaping of an Electron Beam in High-Resolution CRTs for Reduction of Moire Fringes S. Onozawa, S. Mikoshiba, S. Shirai, K. Oku, K. Oshita, M. Sawahata, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to reduce the raster moire fringes appearing in high-resolution CRTs, an evaluation technique is developed which simulates visual appearances of the moire patterns by using a Gaussian weighting method. It has been found that the moire patterns are strongly influenced by a shape of an electron beam profile. By using the evaluation technique, optimum electron beam profiles for various moire modes are pursued. Although the common belief is that the Gaussian current density distribution is the best for the beam profile which gives least moire fringes, it is found that an introduction of a small deviation to the Gaussian distribution reduces the moire contrast to an appreciable extent. This enables us to design CRT electron guns which have an improved moire characteristic. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | raster moire / moire mode / beam profile / Gaussian weighting method |
| Paper # | EID98-237 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 1999/3/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Shaping of an Electron Beam in High-Resolution CRTs for Reduction of Moire Fringes |
| Sub Title (in English) | |
| Keyword(1) | raster moire |
| Keyword(2) | moire mode |
| Keyword(3) | beam profile |
| Keyword(4) | Gaussian weighting method |
| 1st Author's Name | S. Onozawa |
| 1st Author's Affiliation | Department of Electrical Engineering, The University of Electro-Communications() |
| 2nd Author's Name | S. Mikoshiba |
| 2nd Author's Affiliation | Department of Electrical Engineering, The University of Electro-Communications |
| 3rd Author's Name | S. Shirai |
| 3rd Author's Affiliation | Electron Tube & Devices Division, Hitachi, Ltd. |
| 4th Author's Name | K. Oku |
| 4th Author's Affiliation | Electron Tube & Devices Division, Hitachi, Ltd. |
| 5th Author's Name | K. Oshita |
| 5th Author's Affiliation | Electron Tube & Devices Division, Hitachi, Ltd. |
| 6th Author's Name | M. Sawahata |
| 6th Author's Affiliation | Electron Tube & Devices Division, Hitachi, Ltd. |
| Date | 1999/3/19 |
| Paper # | EID98-237 |
| Volume (vol) | vol.98 |
| Number (no) | 666 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |