Presentation 1999/3/18
Stress Analysis of "Micro-Bump Bonding" Structure for "Chip on Glass" Packaging
Shyh-Ming Chang, Jwo-Huei Jou, Hua-Shu Wu, Hong-Yu Lin, Chi-Yuan Wu,
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Abstract(in English) Micro-Bump Bonding (MBB) method makes possible the micro-order direct bonding between IC electrode and circuit substrate electrode. The technology consists of three elements: an IC chip with bumps, a circuit substrate, and a bonding adhesive. The binding forces of the applied adhesive accomplish electrical connection between the bumps on the IC chip and the electrodes on the substrate. Stress analysis is made to estimate the contact force that the adhesive imposes to drag together the bumps of the IC and the electrodes of the substrate. An elastic model is assumed herein to determine the stress characteristic of the MBB structure. The stresses of the structures with gold bumps and compliant bumps are compared at various temperatures. Such a stress analysis is helpful in determining which kind of bumps is more suitable for a given MBB structure.
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Paper # EID98-214
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Committee EID
Conference Date 1999/3/18(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
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Title (in English) Stress Analysis of "Micro-Bump Bonding" Structure for "Chip on Glass" Packaging
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1st Author's Name Shyh-Ming Chang
1st Author's Affiliation LCD Development Division, Electronics Research and Service Organization, Industrial Technology Research Institute:Department of Material Science and Engineering, National Tsing-Hua University()
2nd Author's Name Jwo-Huei Jou
2nd Author's Affiliation Department of Material Science and Engineering, National Tsing-Hua University
3rd Author's Name Hua-Shu Wu
3rd Author's Affiliation Department of Material Science and Engineering, National Tsing-Hua University
4th Author's Name Hong-Yu Lin
4th Author's Affiliation LCD Development Division, Electronics Research and Service Organization, Industrial Technology Research Institute
5th Author's Name Chi-Yuan Wu
5th Author's Affiliation LCD Development Division, Electronics Research and Service Organization, Industrial Technology Research Institute
Date 1999/3/18
Paper # EID98-214
Volume (vol) vol.98
Number (no) 665
Page pp.pp.-
#Pages 5
Date of Issue