Presentation | 1999/3/18 Fabrication and estimation of characteristics for Nb-silicide FEAs Jae Seok Park, Sanjo Lee, Byeong Kwon Ju, Jin Jang, D. Jeon, Myung Hwan Oh, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Electron emission currents and stability in the silicon-tip field emission arrays (FEAs) have bee improved by silicide formation on silicon using Nb (Niobium). The formation of Nb-silicide was confirmed by X-Ray Diffraction (XRD) data. The turn-on voltage of silicon-tip FEAs was decreased from 64 to 47V and the emission current fluctuation was decreased from 5% to 2%. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Silicon-Tip / Field Emission Arrays (FEAs) / Nb (Niobium)-Silicide. |
Paper # | EID98-207 |
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Conference Information | |
Committee | EID |
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Conference Date | 1999/3/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fabrication and estimation of characteristics for Nb-silicide FEAs |
Sub Title (in English) | |
Keyword(1) | Silicon-Tip |
Keyword(2) | Field Emission Arrays (FEAs) |
Keyword(3) | Nb (Niobium)-Silicide. |
1st Author's Name | Jae Seok Park |
1st Author's Affiliation | Electronic Materials and Devices Research Center,KIST() |
2nd Author's Name | Sanjo Lee |
2nd Author's Affiliation | Electronic Materials and Devices Research Center,KIST |
3rd Author's Name | Byeong Kwon Ju |
3rd Author's Affiliation | Electronic Materials and Devices Research Center,KIST |
4th Author's Name | Jin Jang |
4th Author's Affiliation | Department of Physics, Kyung Hee University |
5th Author's Name | D. Jeon |
5th Author's Affiliation | Department of Physics, Myong Ji University |
6th Author's Name | Myung Hwan Oh |
6th Author's Affiliation | Electronic Materials and Devices Research Center,KIST |
Date | 1999/3/18 |
Paper # | EID98-207 |
Volume (vol) | vol.98 |
Number (no) | 665 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |