Presentation | 1999/1/21 Analysis of secondary electron emission yield of MgO thin films Manabu Ishimoto, Souichiro Hidaka, Keiichi Betsui, Tutae Shinoda, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We successfully measured the secondary electron emission yield(γ)of MgO thin films for protecting layer of AC-PDP. We made the measurement apparatus with which we could measure the γ in high stability. The variation of repeating measurement and the long-time(1 hour)measurement were within 5%. With this apparatus, we measured the heat treatment effect on γ, and the relationship between γ and the acceleration voltage of induced ion. And we also measured the energy distribution of secondary electrons from metal(copper)and MgO to investigate the electron emission process. We investigated the difference of the distribution between the metal and non-conductive material, and we discuss the surface charge effect on the distribution. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | MgO / AC-PDP / γ / protecting layer / secondary electron |
Paper # | EID98-107 |
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Conference Information | |
Committee | EID |
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Conference Date | 1999/1/21(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of secondary electron emission yield of MgO thin films |
Sub Title (in English) | |
Keyword(1) | MgO |
Keyword(2) | AC-PDP |
Keyword(3) | γ |
Keyword(4) | protecting layer |
Keyword(5) | secondary electron |
1st Author's Name | Manabu Ishimoto |
1st Author's Affiliation | Fujitsu Laboratories LTD.() |
2nd Author's Name | Souichiro Hidaka |
2nd Author's Affiliation | Fujitsu Laboratories LTD. |
3rd Author's Name | Keiichi Betsui |
3rd Author's Affiliation | Fujitsu Laboratories LTD. |
4th Author's Name | Tutae Shinoda |
4th Author's Affiliation | Fujitsu Laboratories LTD. |
Date | 1999/1/21 |
Paper # | EID98-107 |
Volume (vol) | vol.98 |
Number (no) | 549 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |