Presentation 1999/1/21
Development of a MgO film quality evaluation
Y. Agawa, Y. Yamamoto, S. Amano, N. Sasaki, J. Yuyama,
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Abstract(in English) We are developing a system which measures the secondary electron yield(γ-value)of MgO films. The γ-value is determined by measuring the secondary electron current ejected from the sample irradiated by a mass analyzed ion beam of 50~1000 eV. To improve the S/N ratio the system is designed to suppress electrons generated in the beam transport and to keep the vacuum pressure lower than 10^<-7>Pa. Prior to the construction of this system, we measure γ-values of W and MgO films by Xe ion beam irradiation using an existing low energy ion beam facility. Two kinds of MgO samples were evaporated on stainless steel with different orientations. The obtained γ-value for W is constant over the energy range from 100 to 1000 eV and about 0.02. The γ-value for MgO film showed energy dependence and difference with orientation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) the secondary electron yield / MgO films / orientation
Paper # EID98-104
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Committee EID
Conference Date 1999/1/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of a MgO film quality evaluation
Sub Title (in English)
Keyword(1) the secondary electron yield
Keyword(2) MgO films
Keyword(3) orientation
1st Author's Name Y. Agawa
1st Author's Affiliation ULVAC JAPAN, Ltd.()
2nd Author's Name Y. Yamamoto
2nd Author's Affiliation ULVAC JAPAN, Ltd.
3rd Author's Name S. Amano
3rd Author's Affiliation ULVAC JAPAN, Ltd.
4th Author's Name N. Sasaki
4th Author's Affiliation ULVAC JAPAN, Ltd.
5th Author's Name J. Yuyama
5th Author's Affiliation ULVAC JAPAN, Ltd.
Date 1999/1/21
Paper # EID98-104
Volume (vol) vol.98
Number (no) 549
Page pp.pp.-
#Pages 6
Date of Issue